SFFS596 april   2023 TLV767-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

Overview

This document contains information for the TLV767-Q1 (VSON package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the adjustable output device functional block diagram for reference.

GUID-4AD367E8-3380-4D91-89EE-98BA3FD779DA-low.gif Figure 1-1 TLV767-Q1 Adjustable Output Functional Block Diagram

Figure 1-2 shows the fixed output device functional block diagram for reference.

GUID-7F34A5FC-3FD3-4E9F-8115-C76E9E702774-low.gif Figure 1-2 TLV767-Q1 Fixed Output Functional Block Diagram

The TLV767-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.