SFFS597 april   2023 TPS7B85-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the TPS7B85-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

  • Pin short-circuited to ground (see Table 4-2)
  • Pin open-circuited (see Table 4-3)
  • Pin short-circuited to an adjacent pin (see Table 4-4)
  • Pin short-circuited to supply (see Table 4-5)

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
Class Failure Effects
A Potential device damage that affects functionality.
B No device damage, but loss of functionality.
C No device damage, but performance degradation.
D No device damage, no impact to functionality or performance.

Figure 4-1 shows the TPS7B85-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TPS7B85-Q1 data sheet.

GUID-0CCE979F-ED00-4B04-9929-A9C674DEC542-low.gif Figure 4-1 Pin Diagram
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
OUT 1 Output voltage is at or near ground. The device is in current limit. The device can cycle in and out of thermal shutdown depending on power dissipation. B
PGADJ 2 The PG threshold is set to VPG(TH,FALLING). B
SO 3 Ground current is increased. B
DELAY 4 Ground current is increased. B
NC 5 No effect. Normal operation. D
GND 6 No effect. Normal operation. D
PG 7 Ground current is increased. B
EN 8 The device is always off. B
SI 9 The SO output is always low. B
IN 10 No input to the device. The output is off. B
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
OUT 1 The load is not powered. B
PGADJ 2 PG either trips normally or trips early. The state is indeterminate. B
SO 3 The SO output loses functionality. B
DELAY 4 The power-good delay is t(DLY_FIX). C
NC 5 No effect. Normal operation. D
GND 6 There is no current loop for internal biasing, so the device cannot function. B
PG 7 The PG output is not accessible. B
EN 8 The device state is unknown. The device can be on or off. B
SI 9 SO output is unreliable. Ground current can be increased if SO output is pulled low due to the floating SI input. B
IN 10 No input. The output is at ground. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted to Description of Potential Failure Effects Failure Effect Class
OUT 1 PGADJ The PG output asserts at VOUT = VPGADJ(TH,FALLING) + VPGADJ(HYST). Damage is possible if VOUT exceeds the PGADJ absolute maximum rating. B/A
PGADJ 2 SO If SO is logic high, the PG output asserts at VOUT = VPGADJ(TH,FALLING) + VPGADJ(HYST). If SO is logic low, PG asserts at the default output voltage ratio. B
SO 3 DELAY If SO never asserts, PG cannot assert. If SO asserts and VOUT < DELAY (absolute maximum), the delay function is overridden and the default delay is used. Damage is possible if VOUT exceeds the DELAY absolute maximum rating. B/A
DELAY 4 NC No effect. Normal operation. D
GND 6 PG PG functionality is lost and ground current increases. B
PG 7 EN PG functionality is lost. If EN is pulled low by PG, the device turns off. If VEN > VOUT, the device is not loaded, and VOUT > VPG(TH,RISING), VOUT charges to VEN. Damage is possible if VEN > VPG (absolute maximum). B/A
EN 8 SI The device state (ON/OFF) depends on the voltage at SI, or the SI/SO circuit depends on voltage at EN, depending on which supply has a stronger driving capability to the EN and SI pins. B
SI 9 IN SO is always high. B
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
OUT 1 Regulation is not possible. VOUT = VIN. B
PGADJ 2 PG asserts after the power-good delay period has expired, causing a false power-good signal. PGADJ can be damaged if VIN exceeds the absolute maximum rating for PGADJ. B/A
SO 3 When there is a low-load condition, VOUT can charge to VIN. SO can be damaged if VIN exceeds the absolute maximum rating for SO. B/A
DELAY 4 There is no PG delay. PG trips when the output gets to the target with no delay. B
NC 5 No effect. Normal operation. D
GND 6 No input to the device. The output is off. B
PG 7 When there is a low-load condition, VOUT can charge to VIN. SO can be damaged if VIN exceeds the absolute maximum rating for SO. B/A
EN 8 The device is always on when VIN > VUVLO(RISING). B
SI 9 The SO output is a function of only VIN, VSI(HIGH), and VSI(LOW). B
IN 10 No effect. Normal operation. D