SFFS627 may 2023 INA310A-Q1 , INA310B-Q1
PRODUCTION DATA
The failure mode distribution estimation for the INA310-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Amplifier OUT open (Hi-Z) | 15% |
Amplifier OUT Stuck (High/Low) | 25% |
Amplifier OUT functional, not in specification | 15% |
Comparator CMPOUT false trip, failure to trip | 45% |