SFFS690 June 2024 LM70880-Q1
This section provides functional safety failure in time (FIT) rates for LM708x0-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) | ||
---|---|---|---|
LM70880-Q1 | LM70860-Q1 | LM70840-Q1 | |
Total component FIT rate | 34 | 29 | 26 |
Die FIT rate | 11 | 7 | 5 |
Package FIT rate | 23 | 22 | 21 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Device | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|---|
5 | CMOS, BICMOS ASICs Analog and mixed HV > 50V supply | LM70880-Q1 | 30 FIT | 75°C |
5 | CMOS, BICMOS ASICs Analog and mixed HV > 50V supply | LM70860-Q1 | 30 FIT | 75°C |
5 | CMOS, BICMOS ASICs Analog and mixed HV > 50V supply | LM70840-Q1 | 30 FIT | 75°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.