This document contains information for LM708x0-Q1 (VQFN package)
to aid in a functional safety system design. Information provided are:
- Functional safety failure in time (FIT) rates of
the semiconductor component estimated by the application of industry reliability
standards
- Component failure modes and their
distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (pin FMA)
Figure 1-1 shows the device functional block diagram for reference.
LM708x0-Q1 was developed using a quality-managed
development process, but was not developed in accordance with the IEC 61508 or ISO 26262
standards.