SFFS759 February   2024 CD4051B-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TSSOP Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 CD4051B-Q1 TSSOP Package

CD4051B-Q1 TSSOP Package

Figure 4-1 shows the CD4051B-Q1 pin diagram for the TSSOP package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the CD405xB-Q1 data sheet.

GUID-1F2659C4-F1EF-4143-987B-F0D9D1D407BC-low.svgFigure 4-1 Pin Diagram (TSSOP) Package
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
CH 4 IN/OUT 1 Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

CH 6 IN/OUT

2 Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

COM OUT/IN 3 Corruption of analog signal passed onto the CHx IN/OUT pins. If there is no limiting resistor in the switch path, device damage is possible.

A

CH 7 IN/OUT 4 Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

CH 5 IN/OUT 5 Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

INH6

INH stuck low. Cannot control switch states.

B
VEE7There is no effect; this is normal operation, if the switch path signal voltages are positive. Possible damage to the device if the switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VSS8There is no effect; this is normal operation.

D

C

9

Control of the address pin is lost. Cannot control switch.

B

B

10Control of the address pin is lost. Cannot control switch.B

A

11

Control of the address pin is lost. Cannot control switch.

B

CH 3 IN/OUT

12

Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

CH 0 IN/OUT

13

Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

CH 1 IN/OUT

14

Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

CH 2 IN/OUT

15

Corruption of analog signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, device damage is possible.

A

VDD

16

Device unpowered. Device not functional.

A

Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
CH 4 IN/OUT1Corruption of analog signal passed onto the COM OUT/IN pin.

B

CH 6 IN/OUT

2Corruption of analog signal passed onto the COM OUT/IN pin.

B

COM OUT/IN3Corruption of analog signal passed onto the CHx IN/OUT pins.

B

CH 7 IN/OUT4Corruption of analog signal passed onto the COM OUT/IN pin.

B

CH 5 IN/OUT5Corruption of analog signal passed onto the COM OUT/IN pin.

B

INH6

Loss of control of INH pin. Cannot disable switch. Will default to switches enabled.

B
VEE7Device unpowered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VSS8Device unpowered. Device not functional.

B

C9Control of the address pin is lost. Cannot control switch.

B

B10Control of the address pin is lost. Cannot control switch.B
A11Control of the address pin is lost. Cannot control switch.

B

CH 3 IN/OUT12Corruption of analog signal passed onto the COM OUT/IN pin.

B

CH 0 IN/OUT13Corruption of analog signal passed onto the COM OUT/IN pin.

B

CH 1 IN/OUT14Corruption of analog signal passed onto the COM OUT/IN pin.

B

CH 2 IN/OUT15Corruption of analog signal passed onto the COM OUT/IN pin.

B

VDD16Device unpowered. Device not functional.

B

Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.

Shorted To

Description of Potential Failure EffectsFailure Effect Class
CH 4 IN/OUT1CH 6 IN/OUTPossible corruption of analog signal passed onto CHx and COM pin.

B

CH 6 IN/OUT2COM OUT/INPossible corruption of analog signal passed onto CHx and COM pin.

B

COM OUT/IN3CH 7 IN/OUTPossible corruption of analog signal passed onto CHx and COM pin.

B

CH 7 IN/OUT4CH 5 IN/OUTPossible corruption of analog signal passed onto CHx and COM pin.

B

CH 5 IN/OUT5INHPossible corruption of the signal passed onto the D pin. Switch state will be undefined.

B

INH6VEE

Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VEE7VSSPossible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VSS8

C

Not considered, corner pin.

D

C9

B

Control of the switch state is lost.

B

B10

A

Control of the switch state is lost.B
A11CH 3 IN/OUTPossible corruption of the signal passed onto the CHx and COM pin. Control of the switch state is lost.

B

CH 3 IN/OUT12CH 0 IN/OUTPossible corruption of the signal passed onto the CHx and COM pin.

B

CH 0 IN/OUT13CH 1 IN/OUTPossible corruption of the signal passed onto the CHx and COM pin.

B

CH 1 IN/OUT14CH 2 IN/OUTPossible corruption of the signal passed onto the CHx and COM pin.

B

CH 2 IN/OUT15VDDCorruption of the signal passed onto the CHx pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

VDD16CH 4 IN/OUTNot considered, corner pin.

D

Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
CH 4 IN/OUT1Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

CH 6 IN/OUT2Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

COM OUT/IN3Corruption of the signal passed onto the CHx IN/OUT pins. If there is no limiting resistor in the switch path, then device damage is possible.

A

CH 7 IN/OUT4Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

CH 5 IN/OUT5Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

INH6

INH stuck high. Can no longer enable the device. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VEE7Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VSS8Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

C9Address stuck high. Cannot control switch states.

B

B10Address stuck high. Cannot control switch states.B
A11Address stuck high. Cannot control switch states.

B

CH 3 IN/OUT12Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

CH 0 IN/OUT13Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

CH 1 IN/OUT14Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

CH 2 IN/OUT15Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.

A

VDD16No effect. Normal operation.

D

Table 4-6 Pin FMA for Device Pins Short-Circuited to VEE
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
CH 4 IN/OUT1Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
CH 6 IN/OUT2Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
COM OUT/IN3Corruption of the signal passed onto the CHx IN/OUT pins. If there is no limiting resistor in the switch path, then device damage is possible.A
CH 7 IN/OUT4Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
CH 5 IN/OUT5Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
INH6Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

VEE7

No effect. Normal operation.

D

VSS8Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

C9Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.A
B10Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.

A

A11Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.A
CH 3 IN/OUT12Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
CH 0 IN/OUT13Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
CH 1 IN/OUT14Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
CH 2 IN/OUT15Corruption of the signal passed onto the COM OUT/IN pin. If there is no limiting resistor in the switch path, then device damage is possible.A
VDD16Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible.A