SFFS787 February 2024 TXU0104-Q1
Figure 4-1 shows the TXU0104-Q1 pin diagram for the TSSOP-14 package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TXU0104-Q1 data sheet.
Figure 4-2 shows the TXU0104-Q1 pin diagram for the VQFN-14 package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TXU0104-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VCCA | 1 | Device will not be powered or damaged, because short is external to device. System level damage can occur in this scenario. | B |
A1 | 2 | Ax will be LOW, if corresponding Bx is HIGH, there will be potential damage to the device if the current is not limited. If corresponding Bx is LOW, then nothing will occur, no damage. | B |
A2 | 3 | B | |
A3 | 4 | B | |
A4 | 5 | B | |
NC | 6 | Normal operation. | D |
GND | 7 | Normal operation. | D |
OE | 8 | All I/Os will be fixed into high impedance (tri-state). | B |
NC | 9 | Normal operation. | D |
B4Y | 10 | Bx will be LOW, if corresponding Ax is HIGH, there will be potential damage to the device if the current is not limited. If corresponding Ax is LOW, then nothing will occur, no damage. | B |
B3Y | 11 | B | |
B2Y | 12 | B | |
B1Y | 13 | B | |
VCCB | 14 | Device will not be powered or damaged, because the short is external to device. System level damage can occur in this scenario. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VCCA | 1 | Device will not be powered. | B |
A1 | 2 | Ax pin will be grounded internally. | D |
A2 | 3 | D | |
A3 | 4 | D | |
A4 | 5 | D | |
NC | 6 | Normal operation. | D |
GND | 7 | Device will not be powered. | B |
OE | 8 | I/Os can be high impedance or active, unknown input state. | A |
NC | 9 | Normal operation. | D |
B4Y | 10 | Bx pin will be in HiZ if device is disabled. If device is enabled, it will be HIGH or LOW depending upon the input. | D |
B3Y | 11 | D | |
B2Y | 12 | D | |
B1Y | 13 | D | |
VCCB | 14 | Device will not be powered. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
VCCA | 1 | A1 | Ax will be HIGH, if corresponding Bx is LOW, there will be potential damage to the device if the current is not limited. If corresponding Bx is HIGH, then nothing will occur, no damage. | B |
A1 | 2 | A2 | Two inputs shorted together will not cause damage unless there is external bus contention that drives the input such that VIL < Input Voltage < VIH in which case excessive supply current to GND can cause damage. | B |
A2 | 3 | A3 | B | |
A3 | 4 | A4 | B | |
A4 | 5 | NC | Normal operation. | D |
NC | 6 | GND | Normal operation. | D |
GND | 7 | OE | All I/Os will be fixed into high impedance (tri-state). | B |
OE | 8 | NC | Normal operation. | D |
NC | 9 | B4Y | Normal operation. | D |
B4Y | 10 | B3Y | Two outputs shorted together can cause damage if there is external bus contention that drives one output LOW while driving the other output HIGH. | A |
B3Y | 11 | B2Y | A | |
B2Y | 12 | B1Y | A | |
B1Y | 13 | VCCB | Bx will be HIGH, if corresponding Ax is LOW, there will be potential damage to the device if the current is not limited. If corresponding Ax is HIGH, then nothing will occur, no damage. | B |
VCCB | 14 | VCCA | Device will not be powered or damaged, because short is external to device System level damage can occur in this scenario. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VCCA | 1 | Normal operation. | D |
A1 | 2 | Ax will be HIGH, if corresponding Bx is LOW, there will be potential damage to the device if the current is not limited. If corresponding Bx is HIGH, then nothing will occur, no damage. | B |
A2 | 3 | B | |
A3 | 4 | B | |
A4 | 5 | B | |
NC | 6 | Normal operation. | D |
GND | 7 | Device will not be powered or damaged, because short is external to device. System level damage can occur in this scenario. | B |
OE | 8 | All I/Os will be active, device cannot be disabled. | B |
NC | 9 | Normal operation. | D |
B4Y | 10 | Bx will be HIGH, if corresponding Ax is LOW, there will be potential damage to the device if the current is not limited. If corresponding Ax is HIGH, then nothing will occur, no damage. | B |
B3Y | 11 | B | |
B2Y | 12 | B | |
B1Y | 13 | B | |
VCCB | 14 | Device will not be powered or damaged, because short is external to device. System level damage can occur in this scenario. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
VCCA | 1 | Device will not be powered or damaged, because short is external to device. System level damage can occur in this scenario. | B |
A1 | 2 | Ax will be HIGH, if corresponding Bx is LOW, there will be potential damage to the device if the current is not limited. If corresponding Bx is HIGH, then nothing will occur, no damage. | B |
A2 | 3 | B | |
A3 | 4 | B | |
A4 | 5 | B | |
NC | 6 | Normal operation. | D |
GND | 7 | Device will not be powered or damaged, because short is external to device. System level damage can occur in this scenario. | B |
OE | 8 | All I/Os will be active, device cannot be disabled. | B |
NC | 9 | Normal operation. | D |
B4 | 10 | Bx will be HIGH, if corresponding Ax is LOW, there will be potential damage to the device if the current is not limited. If corresponding Ax is HIGH, then nothing will occur, no damage. | B |
B3 | 11 | B | |
B2 | 12 | B | |
B1 | 13 | B | |
VCCB | 14 | Normal operation. | D |