SFFS789 February 2024 TXV0106-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a Failure Mode Analysis (FMA) for the pins of the TXV0106-Q1 (WQFN package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to Ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (see Table 4-5 and Table 4-6)
Table 4-2 through Table 4-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Figure 4-1 shows the TXV0106-Q1 pin diagram for the WQFN package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TXV0106-Q1 data sheet.
Figure 4-1 Pin
Diagram (WQFN) PackageTable 4-2 Pin
FMA for Device Pins Short-Circuited to
Ground
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCCA | 1 | GND short to VCC, device will be bypassed . This may cause system damage, but not device damage | B |
| A1 - A6 | 2 to 7 | Ax will be LOW, if corresponding Bx is HIGH, there will be potential damage to the device if the current is not limited. If corresponding Bx is LOW, then nothing will occur, no damage. | B |
| GND | 8 | Normal operation. | D |
| OE (active low) | 9 | Outputs will remain enabled | B |
| B6 - B1 | 10 to 15 | Bx will be LOW, if corresponding Ax is HIGH, there will be potential damage to the device if the current is not limited. If corresponding Ax is LOW, then nothing will occur, no damage. | B |
| VCCB | 16 | GND short to VCC, device will be bypassed - may cause system damage, but not device damage | B |
Table 4-3 Pin
FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCCA | 1 | Device will not be powered. | B |
| A1 - A6 | 2 to 7 | Ax input pins will be floating, there will be potential damage to the device if the current is not limited. | A |
| GND | 8 | Device will not be powered. | B |
| OE (active low) | 9 | OE input pin will be floating, there will be potential damage to the device causing outputs to switch between enabled and disabled, if the current is not limited. | B |
| B6 - B1 | 10 to 15 | Bx output pins will be in HiZ if device is disabled. If device is enabled, it will be HIGH or LOW depending on the input. | D |
| VCCB | 16 | Device will not be powered. | B |
Table 4-4 Pin
FMA for Device Pins Short-Circuited to Adjacent
Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| VCCA | 1 | A1 | A1 will be HIGH, if corresponding B1 is LOW, there will be potential damage to the device if the current is not limited. If corresponding B1 is HIGH, then nothing will occur, no damage. | B |
| A(n) | 2 to 6 | A(n+1) | Two inputs shorted together will not cause damage unless there is external bus contention that drives the input such that VIL < Input Voltage < VIH in which case excessive supply current to GND may cause damage. | B |
| A6 | 7 | GND | A6 will be LOW, if corresponding B6 is HIGH, there will be potential damage to the device if the current is not limited. If corresponding B6 is LOW, then nothing will occur, no damage. | B |
| GND | 8 | OE (active low) | Outputs will remain enabled. | B |
| OE (active low) | 9 | B6 | If B6 is HIGH, OE will be LOW and the outputs will remain enabled. If corresponding B6 is LOW, then outputs will be disabled. | B |
| B(n) | 10 to 15 | B(n+1) | Two outputs shorted together may cause damage if there is external bus contention that drives one LOW while driving the other HIGH. | D |
| B1 | 15 | VCCB | B1 will be HIGH, if corresponding A1 is LOW, there will be potential damage to the device if the current is not limited. If corresponding A1 is HIGH, then nothing will occur, no damage. | B |
| VCCB | 16 | VCCA | GND short to VCC, device will be bypassed . This may cause system damage, but not device damage. | B |
Table 4-5 Pin
FMA for Device Pins Short-Circuited to supply
VCCA
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCCA | 1 | Normal operation. | D |
| A1 - A6 | 2 to 7 | Ax will be HIGH, if corresponding Bx is LOW, there will be potential damage to the device if the current is not limited. If corresponding Bx is HIGH, then nothing will occur, no damage. | B |
| GND | 8 | GND short to VCC, device will be bypassed. This may cause system damage, but not device damage. | B |
| OE (active low) | 9 | Outputs will remain disabled. | B |
| B6 - B1 | 10 to 15 | Bx will be HIGH, if corresponding Ax is LOW, there will be potential damage to the device if the current is not limited. If corresponding Ax is HIGH, then nothing will occur, no damage. | B |
| VCCB | 16 | VCCB short to VCCA, device will be bypassed. This may cause system damage, but not device damage. | B |
Table 4-6 Pin
FMA for Device Pins Short-Circuited to supply
VCCB
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCCA | 1 | VCCB short to VCCA, device will be bypassed . This may cause system damage, but not device damage | B |
| A1 - A6 | 2 to 7 | Ax will be HIGH, if corresponding Bx is LOW, there will be potential damage to the device if the current is not limited. If corresponding Bx is HIGH, then nothing will occur; no damage. | B |
| GND | 8 | GND short to VCC, device will be bypassed. This may cause system damage, but not damage to the device. | B |
| OE (active low) | 9 | Outputs will remain disabled. | B |
| B6 - B1 | 10 to 15 | Bx will be HIGH, if corresponding Ax is LOW, there will be potential damage to the device if the current is not limited. If corresponding Ax is HIGH, then nothing will occur, no damage. | B |
| VCCB | 16 | Normal operation. | D |