SFFS843 April   2024 CD74HC4051-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TSSOP Package
    2. 2.2 SOIC Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)

4 Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the CD74HC4051-Q1(TSSOP and SOIC packages). The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Table 4-2 through Table 4-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality
BNo device damage, but loss of functionality
CNo device damage, but performance degradation
DNo device damage, no impact to functionality or performance

Figure 4-1 shows the CD74HC4051-Q1 pin diagram for the TSSOP and SOIC packages. For a detailed description of the device pins, see the Pin Configuration and Functions section in the CD74HC4051-Q1 data sheet.

GUID-69AF8780-B7E3-467F-9201-CA492F6E8265-low.png Figure 4-1 Pin Diagram
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
CHANNEL I/O A4 1 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
CHANNEL I/O A6 2 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
COM OUT/IN A 3 Corruption of analog signal passed onto the CHANNEL I/O Ax pins. If there is no limiting resistor in the switch path, device damage is possible. A
CHANNEL I/O A7 4 Corruption of analog signal passed onto the COM OUT/IN Apin. If there is no limiting resistor in the switch path, device damage is possible. A
CHANNEL I/O A5 5 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
E 6 E stuck low. Cannot control switch states. B
VEE 7 There is no effect; this is normal operation, if the switch path signal voltages are positive. Possible damage to the device if the switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
GND 8 There is no effect; this is normal operation. D
ADDRESS SEL S2 9 Control of the address pin is lost. Cannot control switch. B
ADDRESS SEL S1 10 Control of the address pin is lost. Cannot control switch. B
ADDRESS SEL S0 11 Control of the address pin is lost. Cannot control switch. B
CHANNEL I/O A3 12 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
CHANNEL I/O A0 13 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
CHANNEL I/O A1 14 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
CHANNEL I/O A2 15 Corruption of analog signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, device damage is possible. A
VCC 16 Device unpowered. Device not functional. A
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
CHANNEL I/O A4 1 Corruption of analog signal passed onto the COM OUT/IN A pin. B
CHANNEL I/O A6 2 Corruption of analog signal passed onto the COM OUT/IN A pin. B
COM OUT/IN A 3 Corruption of analog signal passed onto the CHANNEL I/O Ax pins. B
CHANNEL I/O A7 4 Corruption of analog signal passed onto the COM OUT/IN A pin. B
CHANNEL I/O A5 5 Corruption of analog signal passed onto the COM OUT/IN A pin. B
E 6 Loss of control of E pin. Cannot disable switch. Will default to switches enabled. B
VEE 7 Device unpowered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
GND 8 Device unpowered. Device not functional. B
ADDRESS SEL S2 9 Control of the address pin is lost. Cannot control switch. B
ADDRESS SEL S1 10 Control of the address pin is lost. Cannot control switch. B
ADDRESS SEL S0 11 Control of the address pin is lost. Cannot control switch. B
CHANNEL I/O A3 12 Corruption of analog signal passed onto the COM OUT/IN Apin. B
CHANNEL I/O A0 13 Corruption of analog signal passed onto the COM OUT/IN A pin. B
CHANNEL I/O A1 14 Corruption of analog signal passed onto the COM OUT/IN A pin. B
CHANNEL I/O A2 15 Corruption of analog signal passed onto the COM OUT/IN A pin. B
VCC 16 Device unpowered. Device not functional. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted To Description of Potential Failure Effects Failure Effect Class
CHANNEL I/O A4 1 CHANNEL I/O A6 Possible corruption of analog signal passed onto CHx and COM pin. B
CHANNEL I/O A6 2 COM OUT/IN A Possible corruption of analog signal passed onto CHx and COM pin. B
COM OUT/IN A 3 CHANNEL I/O A7 Possible corruption of analog signal passed onto CHx and COM pin. B
CHANNEL I/O A7 4 CHANNEL I/O A5 Possible corruption of analog signal passed onto CHx and COM pin. B
CHANNEL I/O A5 5 E Possible corruption of the signal passed onto the D pin. Switch state will be undefined. B
E 6 VEE Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
VEE 7 GND Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
GND 8 ADDRESS SEL S2 Not considered, corner pin. D
ADDRESS SEL S2 9 ADDRESS SEL S1 Control of the switch state is lost. B
ADDRESS SEL S1 10 ADDRESS SEL S0 Control of the switch state is lost. B
ADDRESS SEL S0 11 CHANNEL I/O A3 Possible corruption of the signal passed onto the CHx and COM pin. Control of the switch state is lost. B
CHANNEL I/O A3 12 CHANNEL I/O A0 Possible corruption of the signal passed onto the CHx and COM pin. B
CHANNEL I/O A0 13 CHANNEL I/O A1 Possible corruption of the signal passed onto the CHx and COM pin. B
CHANNEL I/O A1 14 CHANNEL I/O A2 Possible corruption of the signal passed onto the CHx and COM pin. B
CHANNEL I/O A2 15 VCC Corruption of the signal passed onto the CHx pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 16 CHANNEL I/O A4 Not considered, corner pin. D
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
CHANNEL I/O A4 1 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A6 2 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
COM OUT/IN A 3 Corruption of the signal passed onto the CHANNEL I/O Ax pins. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A7 4 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A5 5 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
E 6 E stuck high. Can no longer enable the device. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
VEE 7 Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
GND 8 Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
ADDRESS SEL S2 9 Address stuck high. Cannot control switch states. B
ADDRESS SEL S1 10 Address stuck high. Cannot control switch states. B
ADDRESS SEL S0 11 Address stuck high. Cannot control switch states. B
CHANNEL I/O A3 12 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A0 13 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A1 14 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A2 15 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 16 No effect. Normal operation. D
Table 4-6 Pin FMA for Device Pins Short-Circuited to VEE
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
CHANNEL I/O A4 1 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A6 2 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
COM OUT/IN A 3 Corruption of the signal passed onto the CHANNEL I/O Ax pins. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A7 4 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A5 5 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
E 6 Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
VEE 7 No effect. Normal operation. D
GND 8 Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
ADDRESS SEL S2 9 Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
ADDRESS SEL S1 10 Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
ADDRESS SEL S0 11 Possible damage to the device if signal voltage is negative. Cannot control switch states. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A
CHANNEL I/O A3 12 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A0 13 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A1 14 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
CHANNEL I/O A2 15 Corruption of the signal passed onto the COM OUT/IN A pin. If there is no limiting resistor in the switch path, then device damage is possible. A
VCC 16 Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. A