SFFS889 July   2024 TMS320F2800132 , TMS320F2800133 , TMS320F2800135 , TMS320F2800137

 

  1.   1
  2.   Trademarks
  3. 1Introduction
  4. 2TMS320F280013x Hardware Component Functional Safety Capability
  5. 3TI Development Process for Management of Systematic Faults
    1. 3.1 TI New-Product Development Process
    2. 3.2 TI Functional Safety Development Process
  6. 4Component Overview
    1. 4.1 Targeted Applications
      1. 4.1.1 TMS320F280013x MCU
    2. 4.2 Hardware Component Functional Safety Concept
      1. 4.2.1 TMS320F280013x MCU Safety Features
      2. 4.2.2 Fault Tolerant Time Interval (FTTI)
      3. 4.2.3 TMS320F280013x MCU Safe State
      4. 4.2.4 Operating States
    3. 4.3 Hardware Component Configuration
      1. 4.3.1 Assumptions of Use - F280013x Self-Test Libraries
      2. 4.3.2 Operational Details - SDL
        1. 4.3.2.1 Operational Details – SDL Module Mapping
    4. 4.4 TMS320F280013x MCU Safety Implementation
      1. 4.4.1 Assumptions of Use
      2. 4.4.2 Example Safety Concept Implementation Options on TMS320F280013x MCU
  7. 5Description of Safety Elements
    1. 5.1 TMS320F280013x MCU Infrastructure Components
      1. 5.1.1 Power Supply
      2. 5.1.2 Clock
      3. 5.1.3 APLL
      4. 5.1.4 Reset
      5. 5.1.5 System Control Module and Configuration Registers
      6. 5.1.6 JTAG Debug, Trace, Calibration, and Test Access
    2. 5.2 Processing Elements
      1. 5.2.1 C28x Central Processing Unit (CPU)
    3. 5.3 Memory (Flash, SRAM and ROM)
      1. 5.3.1 Embedded Flash Memory
      2. 5.3.2 Embedded SRAM
      3. 5.3.3 Embedded ROM
    4. 5.4 On-Chip Communication Including Bus Arbitration
      1. 5.4.1 Device Interconnect
      2. 5.4.2 Enhanced Peripheral Interrupt Expander (ePIE) Module
      3. 5.4.3 Dual Zone Code Security Module (DCSM)
      4. 5.4.4 Crossbar (X-BAR)
      5. 5.4.5 Timer
    5. 5.5 Digital I/O
      1. 5.5.1 General-Purpose Input/Output (GPIO) and Pinmuxing
      2. 5.5.2 Enhanced Pulse Width Modulators (ePWM)
      3. 5.5.3 High Resolution PWM (HRPWM)
      4. 5.5.4 Enhanced Capture (eCAP)
      5. 5.5.5 Enhanced Quadrature Encoder Pulse (eQEP)
      6. 5.5.6 External Interrupt (XINT)
    6. 5.6 Analog I/O
      1. 5.6.1 Analog-to-Digital Converter (ADC)
      2. 5.6.2 Comparator Subsystem (CMPSS)
    7. 5.7 Data Transmission
      1. 5.7.1 Controller Area Network (DCAN)
      2. 5.7.2 Serial Peripheral Interface (SPI)
      3. 5.7.3 Serial Communication Interface (SCI)
      4. 5.7.4 Inter-Integrated Circuit (I2C)
  8. 6Management of Random Faults
    1. 6.1 Fault Reporting
      1. 6.1.1 Suggestions for Improving Freedom From Interference
      2. 6.1.2 Suggestions for Addressing Common Cause Failures
    2. 6.2 Functional Safety Mechanism
    3. 6.3 Description of Functional Safety Mechanisms
      1. 6.3.1 TMS320F280013x MCU Infrastructure Components
        1. 6.3.1.1  Clock Integrity Check Using DCC
        2. 6.3.1.2  Clock Integrity Check Using CPU Timer
        3. 6.3.1.3  Clock Integrity Check Using HRPWM
        4. 6.3.1.4  EALLOW Protection for Critical Registers
        5. 6.3.1.5  External Monitoring of Clock via XCLKOUT
        6. 6.3.1.6  External Monitoring of Warm Reset (XRSn)
        7. 6.3.1.7  External Voltage Supervisor
        8. 6.3.1.8  External Watchdog
        9. 6.3.1.9  Glitch Filtering on Reset Pins
        10. 6.3.1.10 Hardware Disable of JTAG Port
        11. 6.3.1.11 Lockout of JTAG Access Using OTP
        12. 6.3.1.12 Internal Watchdog (WD)
        13. 6.3.1.13 Lock Mechanism for Control Registers
        14. 6.3.1.14 Missing Clock Detect (MCD)
        15. 6.3.1.15 NMIWD Reset Functionality
        16. 6.3.1.16 NMIWD Shadow Registers
        17. 6.3.1.17 Multi-Bit Enable Keys for Control Registers
        18. 6.3.1.18 Online Monitoring of Temperature
        19. 6.3.1.19 Periodic Software Read Back of Static Configuration Registers
        20. 6.3.1.20 Peripheral Clock Gating (PCLKCR)
        21. 6.3.1.21 Peripheral Soft Reset (SOFTPRES)
        22. 6.3.1.22 Software Test of Reset - Type 1
        23. 6.3.1.23 PLL Lock Profiling Using On-Chip Timer
        24. 6.3.1.24 Reset Cause Information
        25. 6.3.1.25 Software Read Back of Written Configuration
        26. 6.3.1.26 Software Test of ERRORSTS Functionality
        27. 6.3.1.27 Software Test of Missing Clock Detect Functionality
        28. 6.3.1.28 Software Test of Watchdog (WD) Operation
        29. 6.3.1.29 Dual-Clock Comparator (DCC) - Type 2
        30. 6.3.1.30 PLL Lock Indication
        31. 6.3.1.31 Software Test of DCC Functionality Including Error Tests
        32. 6.3.1.32 Software Test of PLL Functionality Including Error Tests
        33. 6.3.1.33 Interleaving of FSM States
        34. 6.3.1.34 Brownout Reset (BOR)
      2. 6.3.2 Processing Elements
        1. 6.3.2.1 CPU Handling of Illegal Operation, Illegal Results, and Instruction Trapping
        2. 6.3.2.2 Stack Overflow Detection
        3. 6.3.2.3 CRC Check of Static Memory Contents
      3. 6.3.3 Memory (Flash, SRAM and ROM)
        1. 6.3.3.1  Bit Multiplexing in Flash Memory Array
        2. 6.3.3.2  Bit Multiplexing in SRAM Memory Array
        3. 6.3.3.3  Data Scrubbing to Detect/Correct Memory Errors
        4. 6.3.3.4  Flash ECC
        5. 6.3.3.5  Flash Program Verify and Erase Verify Check
        6. 6.3.3.6  Flash Program/Erase Protection
        7. 6.3.3.7  Flash Wrapper Error and Status Reporting
        8. 6.3.3.8  Prevent 0 to 1 Transition Using Program Command
        9. 6.3.3.9  On-Demand Software Program Verify and Blank Check
        10. 6.3.3.10 CMDWEPROT* and Program Command Data Buffer Registers Self-Clear After Command Execution
        11. 6.3.3.11 ECC Generation and Checker Logic is Separate in Hardware
        12. 6.3.3.12 Auto ECC Generation Override
        13. 6.3.3.13 Software Test of ECC Logic
        14. 6.3.3.14 Software Test of Flash Prefetch, Data Cache, and Wait-States
        15. 6.3.3.15 Access Protection Mechanism for Memories
        16. 6.3.3.16 SRAM ECC
        17. 6.3.3.17 SRAM Parity
        18. 6.3.3.18 Software Test of Parity Logic
        19. 6.3.3.19 Software Test of SRAM
        20. 6.3.3.20 Memory Power-On Self-Test (MPOST)
        21. 6.3.3.21 ROM Parity
      4. 6.3.4 On-Chip Communication Including Bus-Arbitration
        1. 6.3.4.1 1oo2 Software Voting Using Secondary Free Running Counter
        2. 6.3.4.2 Maintaining Interrupt Handler for Unused Interrupts
        3. 6.3.4.3 Power-Up Pre-Operational Security Checks
        4. 6.3.4.4 Majority Voting and Error Detection of Link Pointer
        5. 6.3.4.5 Software Check of X-BAR Flag
        6. 6.3.4.6 Software Test of ePIE Operation Including Error Tests
      5. 6.3.5 Digital I/O
        1. 6.3.5.1  eCAP Application Level Safety Mechanism
        2. 6.3.5.2  ePWM Application Level Safety Mechanism
        3. 6.3.5.3  ePWM Fault Detection Using X-BAR
        4. 6.3.5.4  ePWM Synchronization Check
        5. 6.3.5.5  eQEP Application Level Safety Mechanism
        6. 6.3.5.6  eQEP Quadrature Watchdog
        7. 6.3.5.7  eQEP Software Test of Quadrature Watchdog Functionality
        8. 6.3.5.8  Hardware Redundancy
        9. 6.3.5.9  HRPWM Built-In Self-Check and Diagnostic Capabilities
        10. 6.3.5.10 Information Redundancy Techniques
        11. 6.3.5.11 Monitoring of ePWM by eCAP
        12. 6.3.5.12 Monitoring of ePWM by ADC
        13. 6.3.5.13 Online Monitoring of Periodic Interrupts and Events
        14. 6.3.5.14 Software Test of Function Including Error Tests
        15. 6.3.5.15 QMA Error Detection Logic
      6. 6.3.6 Analog I/O
        1. 6.3.6.1 ADC Information Redundancy Techniques
        2. 6.3.6.2 ADC Input Signal Integrity Check
        3. 6.3.6.3 ADC Signal Quality Check by Varying Acquisition Window
        4. 6.3.6.4 CMPSS Ramp Generator Functionality Check
        5. 6.3.6.5 DAC to ADC Loopback Check
        6. 6.3.6.6 Opens/Shorts Detection Circuit for ADC
        7. 6.3.6.7 Disabling Unused Sources of SOC Inputs to ADC
      7. 6.3.7 Data Transmission
        1. 6.3.7.1  Information Redundancy Techniques Including End-to-End Safing
        2. 6.3.7.2  Bit Error Detection
        3. 6.3.7.3  CRC in Message
        4. 6.3.7.4  DCAN Acknowledge Error Detection
        5. 6.3.7.5  DCAN Form Error Detection
        6. 6.3.7.6  DCAN Stuff Error Detection
        7. 6.3.7.7  Software Test of Function Including Error Tests Using EPG
        8. 6.3.7.8  I2C Access Latency Profiling Using On-Chip Timer
        9. 6.3.7.9  I2C Data Acknowledge Check
        10. 6.3.7.10 Parity in Message
        11. 6.3.7.11 SCI Break Error Detection
        12. 6.3.7.12 Frame Error Detection
        13. 6.3.7.13 Overrun Error Detection
        14. 6.3.7.14 Software Test of Function Using I/O Loopback
        15. 6.3.7.15 SPI Data Overrun Detection
        16. 6.3.7.16 Transmission Redundancy
  9.   A Summary of Safety Features and Diagnostics
  10.   B References

5.2.1 C28x Central Processing Unit (CPU)

The CPU is a 32-bit fixed-point processor with Floating Point Unit (FPU) and Trigonometric Math Unit (TMU) instruction set extensions. This device draws from the best features of digital signal processing, reduced instruction set computing (RISC), microcontroller architectures, firmware, and tool sets. The CPU features include a modified Harvard architecture and circular addressing. The RISC features are single-cycle instruction execution and register-to-register operations. The modified Harvard architecture of the CPU enables instruction and data fetches to be performed in parallel. The CPU does this over six separate address and data buses. The unique architecture of the CPU makes the CPU amenable to integrating safety features external to the CPU but on chip, which provides improved diagnostic coverage.

The following tests can be applied as diagnostics for this module (to provide diagnostic coverage on a specific function):

Note: Measures to mitigate common cause failure in the CPU subsystem: Common-cause failures are one of the important failure modes when a safety-related design is implemented in a silicon device. The contribution of hardware and software dependent failures is estimated on a qualitative basis because no general and sufficiently reliable method exists for quantifying such failures. The system integrator must perform a detailed analysis based on the inputs from ISO 26262-11:2018, Section 4.7 and IEC 61508-2:2010 Annex E (BetaIC method).