SFFS900 June 2024 LM74703-Q1 , LM74704-Q1
The failure mode distribution estimation for LM74703-Q1 and LM74704-Q1 in Table 3-1comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
GATE output voltage or timing not in specification | 25% |
GATE Stuck at High | 20% |
GATE stuck at Low | 30% |
FETGOOD fails to trip or false trip | 20% |
Pin to Pin short | 5% |