SFFS911 December 2024 TMAG5110-Q1 , TMAG5111-Q1
The failure mode distribution estimations for the TMAG5110-Q1 in Table 3-1 and TMAG5111-Q1 in Table 3-2 come from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Output stuck in HIGH state | 5 |
Output stuck in LOW state | 25 |
Output stuck Hi-Z | 25 |
Magnetic threshold error (BOP/BRP out of specification) | 45 |
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Output stuck in HIGH state | 5 |
Output stuck in LOW state | 25 |
Output stuck Hi-Z | 25 |
Direction output toggle at incorrect moment | 5 |
Magnetic threshold error (BOP/BRP out of specification) | 40 |