SFFS911 December   2024 TMAG5110-Q1 , TMAG5111-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TMAG5110-Q1
    2. 2.2 TMAG5111-Q1
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 TMAG5110-Q1
    2. 4.2 TMAG5111-Q1
  7. 5Revision History

Failure Mode Distribution (FMD)

The failure mode distribution estimations for the TMAG5110-Q1 in Table 3-1 and TMAG5111-Q1 in Table 3-2 come from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 TMAG5110-Q1 Die Failure Modes and Distribution
Die Failure Modes Failure Mode Distribution (%)
Output stuck in HIGH state 5
Output stuck in LOW state 25
Output stuck Hi-Z 25
Magnetic threshold error (BOP/BRP out of specification) 45
Table 3-2 TMAG5111-Q1 Die Failure Modes and Distribution
Die Failure Modes Failure Mode Distribution (%)
Output stuck in HIGH state 5
Output stuck in LOW state 25
Output stuck Hi-Z 25
Direction output toggle at incorrect moment 5
Magnetic threshold error (BOP/BRP out of specification) 40