SFFS927 July   2024 ISO7741TA-Q1 , ISO7741TB-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 16-DW SOIC Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 16-DW SOIC Package

16-DW SOIC Package

Figure 4-1 shows the ISO7741Tx-Q1 pin diagram for the 16-DW SOIC package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the ISO7741Tx-Q1 data sheet.

ISO7741TA-Q1 ISO7741TB-Q1 Pin Diagram (16-DW SOIC) Package Figure 4-1 Pin Diagram (16-DW SOIC) Package
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
D1 1 D1 pin shorted to ground creates short circuit path between VCC1 and ground through transformer winding, causing high current to flow and possible damage to transformer or device. Output voltage out of target operating point. A
D2 2 D2 pin shorted to ground creates short circuit path between VCC1 and ground through transformer winding, causing high current to flow and possible damage to transformer or device. Output voltage out of target operating point. A
GND1 3 Device continues to function as expected. Normal operation. D
VCC1 4 No power to device side-1 (supply input shorted to ground). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output state is undetermined. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage is possible. A
INA 5 Input signal shorted to ground, so OUTA output is stuck low. Communication from INA to OUTA is corrupted. B
INB 6 Input signal shorted to ground, so OUTB output is stuck low. Communication from INB to OUTB is corrupted. B
INC 7 Input signal shorted to ground, so OUTC output is stuck low. Communication from INC to OUTC is corrupted. B
OUTD 8 OUTD output shorted to ground. Data communication from IND to OUTD is corrupted. Device damage is possible if IND is driven high for an extended period of time. A
GND2 9 Device continues to function as expected. Normal operation. D
IND 10 Input signal shorted to ground, so OUTD output is stuck low. Communication from IND to OUTD is corrupted. B
OUTC 11 OUTC output shorted to ground. Data communication from INC to OUTC is corrupted. Device damage is possible if INC is driven high for an extended period of time. A
OUTB 12 OUTB output shorted to ground. Data communication from INB to OUTB is corrupted. Device damage is possible if INB is driven high for an extended period of time. A
OUTA 13 OUTA output shorted to ground. Data communication from INA to OUTA is corrupted. Device damage is possible if INA is driven high for an extended period of time. A
NC 14 Device continues to function as expected. Normal operation. D
GND2 15 Device continues to function as expected. Normal operation. D
VCC2 16 No power to the device on side-2. State of OUTA/OUTB/OUTC outputs are undetermined. OUTD output is at default state. B
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
D1 1 With D1 open, one primary transformer winding does not store energy. Output voltage out of target operating point. B
D2 2 With D2 open, one primary transformer winding does not store energy. Output voltage out of target operating point. B
GND1 3 No power to device side-1 (missing ground return). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output is undetermined. B
VCC1 4 No power to device side-1 (supply is open). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output is undetermined or through internal ESD diode on INA/INB/INC pin the device can power up if any IN is driven to logic high. If IN has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage is plausible. B
INA 5 No communication to INA channel is possible. OUTA output at default state. B
INB 6 No communication to INB channel is possible. OUTB output at default state. B
INC 7 No communication to INC channel is possible. OUTC output at default state. B
OUTD 8 State of OUTD output undetermined. Data communication from IND to OUTD is corrupted. B
GND2 9 Device gets return ground through pin15. Normal operation. D
IND 10 No communication to IND channel is possible. OUTD output at default state. B
OUTC 11 State of OUTC output is undetermined. Data communication from INC to OUTC is corrupted. B
OUTB 12 State of OUTB output is undetermined. Data communication from INB to OUTB is corrupted. B
OUTA 13 State of OUTA output is undetermined. Data communication from INA to OUTA is corrupted. B
NC 14 Device continues to function as expected. Normal operation. D
GND2 15 Device gets return ground through pin 9. Normal operation. D
VCC2 16 No power to the device on side-2 (supply is open). State of OUTA/OUTB/OUTC outputs are undetermined. OUTD output at default state. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted to Description of Potential Failure Effects Failure Effect Class
D1 1 D2 With D1 shorted to D2, there is incorrect current flow in the primary transformer windings. Output voltage out of target operating point. A
D2 2 GND D2 pin shorted to ground creates short circuit path between VCC1 and ground through transformer winding, causing high current to flow and possible damage to transformer or device. Output voltage out of target operating point. A
GND1 3 VCC1 No power to device side-1 (supply input shorted to ground). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output state is undetermined. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage is possible. A
VCC1 4 INA Input signal shorted to supply, so OUTA output is stuck high. Communication from INA to OUTA is corrupted. B
INA 5 INB Communication corrupted for either or both channels. B
INB 6 INC Communication corrupted for either or both channels. B
INC 7 OUTD Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. A
OUTD 8 - Not considered, corner pin. -
GND2 9 IND Input signal shorted to ground, so OUTD output is stuck low. Communication from IND to OUTD is corrupted. B
IND 10 OUTC Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. A
OUTC 11 OUTB Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. A
OUTB 12 OUTA Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. A
OUTA 13 NC Device continues to function as expected. Normal operation. D
NC 14 GND2 Device continues to function as expected. Normal operation. D
GND2 15 VCC2 No power to the device on side-2 (supply is shorted to ground). State of OUTA/OUTB/OUTC outputs are undetermined. OUTD output at default state. B
VCC2 16 - Not considered corner pin. -
Table 4-5 Pin FMA for Device Pins Short-Circuited to supply
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
D1 1 D1 stuck high. Makes potential difference between one transformer winding zero. When D1 FET switches are on, high current flows from supply to ground and device damage is possible. Isolated output supply out of intended set-point. A
D2 2 D2 stuck high. Makes potential difference between one transformer winding zero. When D2 FET switches on, high current flows from supply to ground and device damage is possible. Isolated output supply out of intended set-point. A
GND1 3 No power to device side-1 (supply input shorted to ground). No switching action of D1/D2 and isolated output voltage does not build up. OUTA/OUTB/OUTC outputs are at default logic state. OUTD output state is undetermined. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage is possible. A
VCC1 4 No effect. Normal operation. D
INA 5 Input signal shorted to supply, so OUTA output is stuck high. Communication from INA to OUTA is corrupted. B
INB 6 Input signal shorted to supply, so OUTB output is stuck high. Communication from INB to OUTB is corrupted. B
INC 7 Input signal shorted to supply, so OUTB output is stuck high. Communication from INB to OUTB is corrupted. B
OUTD 8 OUTD stuck high. Data communication from INC to OUTC is lost. Device damage is possible if IND is driven low for an extended period of time. A
GND2 9 Can create a potential difference between pin9 and pin15, causing high current to flow in the device and device damage is possible. A
IND 10 Input signal shorted to supply, so OUTD output is stuck high. Communication from IND to OUTD is corrupted. B
OUTC 11 OUTC shorted to supply (high). Communication from INC to OUTC is corrupted. If INC is low for extended duration, OUTC shorted to supply causes high current and can possibly damage the device. A
OUTB 12 OUTB shorted to supply (high). Communication from INB to OUTB is corrupted. If INB is low for an extended duration, OUTB shorted to supply causes high current and can possibly damage the device. A
OUTA 13 OUTA shorted to supply (high). Communication from INA to OUTA is corrupted. If INA is low for extended duration, OUTA shorted to supply causes high current and can possibly damage the device. A
NC 14 Device continues to function as expected. Normal operation. D
GND2 15 Shorting pin 15 to supply can create potential difference between pin9 and pin15, causing high current to flow in the device and device damage is possible. A
VCC2 16 Device continues to function as expected. Normal operation. D