SFFS957 August 2024 LMR51606-Q1 , LMR51610-Q1
The failure mode distribution estimation for LMR51606-Q1 and LMR51610-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity are from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| SW Output | 50 |
| SW output not in specification voltage or timing | 45 |
| SW driver FET stuck on | 5 |