SFFS958 July   2024 TPS62916-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for the TPS6291x-Q1 (VQFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

TPS62914-Q1 TPS62916-Q1 TPS62918-Q1 TPS6291x-Q Functional Block Diagram Figure 1-1 Functional Block Diagram

The TPS6291x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.

ADVANCE INFORMATION for preproduction products; subject to change without notice.