SFFS992 September 2024 LMR51603-Q1
The failure mode distribution estimation for LMR51603-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity are from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Software output | 50 |
Software output not in specification voltage or timing | 45 |
Software driver FET stuck on | 5 |