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This document contains information for TCAN1472-Q1 and TCAN1472V-Q1 to aid in a functional safety system design. These devices are controller area network (CAN) signal improvement capable (SIC) transceivers compliant to CiA 601-4 and are available in the SOIC (D), VSON (DRB), and SOT (DDF) packages. Information provided are:
Figure 1-1 shows the device functional block diagram for reference. TCAN1472V-Q1 has the VIO input at pin 5, while TCAN1472-Q1 has a no connect (NC) at pin 5.
This section provides functional safety failure in time (FIT) rates for TCAN1472-Q1 and TCAN1472V-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) | FIT (Failures Per 109 Hours) 8-pin SOT (DDF) |
---|---|---|---|
Total component FIT rate | 10 | 7 | 5 |
Die FIT rate | 3 | 3 | 3 |
Package FIT rate | 7 | 4 | 2 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog and Mixed = <50V supply | 25 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.