SFFSA20 November   2024 LM5190

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
  7. 5Revision History

Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the LM5190 and LM25190. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects
ClassFailure Effects
APotential device damage that affects functionality.
BNo device damage, but loss of functionality.
CNo device damage, but performance degradation.
DNo device damage, no impact to functionality or performance.

Figure 4-1 shows the LM5190 and LM25190 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the LM5190 and LM25190 data sheets.

LM5190 LM25190 LMx5190 Pin Diagram Figure 4-1 Pin Diagram
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
Pin NamePin No.Description of Potential Failure EffectsFailure Effect Class
ISET1VOUT = 0V. ISET is not functional.B
RT2VOUT attempts to regulate at maximum fsw, causing maximum power dissipation.C
COMP3VOUT = 0V.B
FB4VOUT target set to 5V.B
AGND5AGND is GND. VOUT = expected VOUT.D
IMON/ILIM6VOUT = expected VOUT. Current monitor and CC limit are not functional.B
VCC7VOUT = 0V, no switching, loaded VCC output.B
PGND8PGND is GND. VOUT = expected VOUT.D
LO9VOUT = 0V, the VCC regulator is loaded to current limit.B
VIN10VOUT = 0V.B
HO11VOUT = 0V, the VCC regulator is loaded to current limit.B
SW12VOUT = 0V. High-side FET is shorted from VIN to GND.A
CBOOT13VOUT = 0V. High-side FET is shorted from VIN to GND.B
BIAS14VOUT = expected VOUT. Internal VCC regulator provides bias voltage.C
PGOOD15VOUT = expected VOUT. PGOOD is not functional.C
FPWM/SYNC16VOUT = expected VOUT. No synchronization is available and always in PFM mode.C
EN17VOUT = 0V. Always in shutdown.B
ISNS+18VOUT = 0V.A
VOUT19VOUT = 0V.B
Table 4-3 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
ISET 1 VOUT = expected VOUT. ISET is not functional. C
RT 2 RT regulates to 1V, but the internal oscillator does not function. B
COMP 3 VOUT oscillates. A
FB 4 VOUT = VIN. A
AGND 5 VOUT is indeterminate. B
IMON/ILIM 6 VOUT = 0V. Current monitor and CC limit are not functional. B
VCC 7 VOUT = 0V. B
PGND 8 VOUT = 0V. B
LO 9 VOUT = expected VOUT with reduced efficiency. C
VIN 10 VOUT = 0V. B
HO 11 If HO is opened while HO to SW has voltage, the high-side FET never turns off. VOUT = VIN. A
SW 12 VOUT is indeterminate. The CBOOT floating rail has no reference to the actual SW node. VOUT = VIN. A
CBOOT 13 VOUT = 0V. B
BIAS 14 VOUT = expected VOUT. Internal VCC regulator provides bias voltage. C
PGOOD 15 VOUT = expected VOUT. PGOOD is not functional. C
FPWM/SYNC 16 VOUT = expected VOUT. No synchronization is available and always in FPWM mode. C
EN 17 VOUT = 0V. B
ISNS+ 18 The open ISNS+ pin blocks current limit and causes VOUT oscillations. A
VOUT 19 VOUT = 0V, if the internal feedback is used. B
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Name Pin No. Shorted to Description of Potential Failure Effects Failure Effect Class
ISET 1 RT

If RT resistor is tied to VCC, ISET pin can be damaged.

If RT resistor is tied to AGND, VOUT = expected VOUT. The switching frequency is lower. CC operation is affected.

A
RT 2 COMP

If RT resistor is tied to VCC, COMP pin can be damaged.

If RT resistor is tied to AGND, VOUT = 0V.

A
COMP 3 FB External FB mode: COMP regulates to 0.8V and output is unregulated. VOUT = indeterminate. B
Internal FB mode FB = VCC, device is damaged. A
Internal FB mode FB = GND, VOUT = 0V. B
FB 4 AGND VOUT target set to 5V. B
AGND 5 IMON/ILIM VOUT = expected VOUT. Current monitor and CC limit are not functional. C
IMON/ILIM 6 VCC Device damage. A
VCC 7 PGND VCC is grounded. VOUT = 0V. B
PGND 8 LO VOUT = 0V. VCC is loaded by the LO driver. B
LO 9 VIN VOUT = 0V. The driver is damaged if VIN > 8V. A
VIN 10 HO

For VIN > 8V, exceeds the maximum ratings and the HO pin is damaged.

For VIN < 8V, VOUT = dropout lower than VIN, no switching, and excess current from VIN.

A
HO 11 SW VOUT = 0V. B
SW 12 CBOOT VOUT = 0V. B
CBOOT 13 BIAS Device damage if CBOOT > 30V. A
BIAS 14 PGOOD PG pulldown can damage. VOUT = expected VOUT. A
PGOOD 15 FPWM/SYNC

VOUT = expected VOUT.

If FPWM is tied to VCC, PG pulldown can be damaged.

A
FPWM/SYNC 16 EN VOUT = expected VOUT. A
EN 17 ISNS+ EN is high-voltage rated. VOUT = expected VOUT if VOUT > 1V. If VOUT < 1V, the device is disabled. B
ISNS+ 18 VOUT

Current limit is disabled since the current limit resistor is shorted.

VOUT cannot regulate since current-mode feedback is shorted.

A
VOUT 19 ISET

VOUT = 0V.

If prebias VOUT > 5.5V, ISET pin is damaged.

A
Table 4-5 Pin FMA for Device Pins Short-Circuited to VIN
Pin Name Pin No. Description of Potential Failure Effects Failure Effect Class
ISET 1 Device damage if VIN > 5.5V. A
RT 2

Device damage if VIN > 8V.

A
COMP 3

Device damage if VIN > 5.5V

If VIN < 5.5V, VOUT out of regulation.

A
FB 4

Device damage if VIN > 8V.

If VIN < 8V, VOUT = VIN.

A
AGND 5 VOUT = 0V. B
IMON/ILIM 6 Device damage if VIN > 5.5V. A
VCC 7

Device damage if VIN > 8V.

If VIN < 8V, VOUT = expected VOUT.

A
PGND 8 VOUT = 0V. B
LO 9 VOUT = 0V. The driver is damaged if VIN > 8V. A
VIN 10 N/A D
HO 11

For VIN > 8V, exceeds maximum ratings and the HO pin is damaged

For VIN < 8V, VOUT = dropout lower than VIN, no switching, and excess current from VIN

A
SW 12 VOUT = VIN, excess current from VIN. LO turns on and shorts against VIN. B
CBOOT 13

Device damage if VIN > 8V.

If VIN < 8V, VOUT < expected VOUT.

A
BIAS 14 Device damage if VIN > 30V. A
PGOOD 15 Device damage. A
FPWM/SYNC 16

Device damage if VIN > 8V.

If VIN < 8V, VOUT = expected VOUT but always FPWM mode.

A
EN 17 Always on. VOUT = expected VOUT. C
ISNS+ 18 Device damage. A
VOUT 19 VOUT = VIN. B