SFFSA43 December   2024 LM5125-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 VQFN Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 VQFN Package
  7. 5Revision History

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the LM5125-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
HO1/2 or LO1/2 gate driver is stuck on5
HO1/2 or LO1/2 gate driver is stuck off15
HO1/2 or LO1/2 gate driver is Hi-Z5
VCC LDO output voltage out of specification15
VOUT voltage out of specification40
PGOOD false or fails to trip10
Digital control malfunctions or electrical parameters out of specification 10