SLAAEC6A October 2023 – January 2024
The diagnostics test circuitry, as shown in Figure 3-14, is not connected to any channel by default. Populate J48 and J51 jumpers to enable IN1P and IN1M diagnostic test. Only one channel can be tested at a time with the on-board diagnostics test circuitry. A fault is introduced by pressing SW2.
The diagnostic test selection is done by populating one jumper at any time on the J52 header either for input to MICBIAS short, input to VBAT short, input to input short, or input to ground short. Once the connection is established, press SW2 to initiate the test; the fault detection can then be verified through the device register. The bidirectional arrow indicates moving the switch to the left for the IN1P test and to the right for the IN1M test.
TI's recommended settings for this diagnostics test circuit are discussed in this section. The following figures below are based on a newer EVM revision, which has IN1P and IN1M connected by default through J48 and J51.