SLAK024A January   2019  – March 2024 TPS73801-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects
  6. 3Test Device and Evaluation Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Single-Event-Burnout (SEB) and Single-Event-Latch-up (SEL)
    1. 6.1 Single-Event-Burnout (SEB)
    2. 6.2 Single-Event-Latch-up (SEL)
  10. 7SET Results
  11. 8Summary
  12.   A Confidence Interval Calculations
  13.   B References
  14.   C Revision History

Abstract

The effects of heavy-ion irradiation on the single-event effect performance of the TPS73801-SEP LDO regulator is summarized in this report. Heavy ions up to 43MeV-cm2 / mg were used to irradiate production devices in 17 experiments with fluences of 107 ions / cm2. The results show that the TPS73801-SEP is SEL and SEB free up to 43MeV-cm2/mg across the full electrical specification with upper bound cross section on the 10–7 cm2/device. SETs were characterized at VOUT = 2.5V and 12V; and at VIN = 5V and 15V, respectively. Exclusions greater than ±5% around the nominal voltages, were categorized as an upset. For the SET characterization, only seven upsets were observed on the 16 experiments (or runs) and were all at VOUT = 2.5V. The upper bound cross section for the SETs is on the order of 10–8 cm2 / device.