Table 5-59 Analog Comparator Characteristics
over operating free-air temperature (unless otherwise noted) (1)(2) PARAMETER | MIN | TYP | MAX | UNIT |
VINP, VINN(3) |
Input voltage range |
GNDA |
| VDDA |
V |
VCM |
Input common-mode voltage range |
GNDA |
| VDDA |
V |
VOS |
Input offset voltage |
| ±10 |
±50 (5) |
mV |
IINP, IINN |
Input leakage current over full voltage range |
| | 2.0 |
µA |
CMRR |
Common-mode rejection ratio |
| 50 |
| dB |
tRT |
Response time |
| | 1.0 (4) |
µs |
tMC |
Comparator mode change to output valid |
| | 10 |
µs |
(1) Best design practices suggest placing static or quiet digital I/O signals adjacent to sensitive analog inputs to reduce capacitive coupling and crosstalk.
(2) To achieve best analog results, keep the source resistance driving the analog inputs, VINP and VINN, low.
(3) The external voltage inputs to the analog comparator are designed to be highly sensitive and can be affected by external noise on the board. For this reason, VINP and VINN must be set to different voltage levels during idle states to ensure the analog comparator triggers are not enabled. If an internal voltage reference is used, it should be set to a mid-supply level. When operating in sleep or deep-sleep modes, disable the analog comparator module or set the external voltage inputs to different levels (greater than the input offset voltage) to achieve minimum current draw.
(4) Measured at external VREF = 100 mV, input signal switching from 75 mV to 125 mV
(5) Measured at VREF = 100 mV
Table 5-60 lists the characteristics for the comparator.