SLASEW8A October   2020  – September 2023 DAC43701-Q1 , DAC53701-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements: I2C Standard Mode
    7. 6.7  Timing Requirements: I2C Fast Mode
    8. 6.8  Timing Requirements: I2C Fast-Mode Plus
    9. 6.9  Timing Requirements: GPI
    10. 6.10 Timing Diagram
    11. 6.11 Typical Characteristics: VDD = 5.5 V (Reference = VDD) or VDD = 5 V (Internal Reference)
    12. 6.12 Typical Characteristics: VDD = 1.8 V (Reference = VDD) or VDD = 2 V (Internal Reference)
    13. 6.13 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Digital-to-Analog Converter (DAC) Architecture
        1. 7.3.1.1 Reference Selection and DAC Transfer Function
          1. 7.3.1.1.1 Power Supply as Reference
          2. 7.3.1.1.2 Internal Reference
      2. 7.3.2 General-Purpose Input (GPI)
      3. 7.3.3 DAC Update
        1. 7.3.3.1 DAC Update Busy
      4. 7.3.4 Nonvolatile Memory (EEPROM or NVM)
        1. 7.3.4.1 NVM Cyclic Redundancy Check
        2. 7.3.4.2 NVM_CRC_ALARM_USER Bit
        3. 7.3.4.3 NVM_CRC_ALARM_INTERNAL Bit
      5. 7.3.5 Programmable Slew Rate
      6. 7.3.6 Power-On Reset (POR)
      7. 7.3.7 Software Reset
      8. 7.3.8 Device Lock Feature
      9. 7.3.9 PMBus Compatibility
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power Down Mode
      2. 7.4.2 Continuous Waveform Generation (CWG) Mode
      3. 7.4.3 PMBus Compatibility Mode
    5. 7.5 Programming
      1. 7.5.1 F/S Mode Protocol
      2. 7.5.2 I2C Update Sequence
        1. 7.5.2.1 Address Byte
          1. 7.5.2.1.1 Target Address Configuration
        2. 7.5.2.2 Command Byte
      3. 7.5.3 I2C Read Sequence
    6. 7.6 Register Map
      1. 7.6.1  STATUS Register (address = D0h) [reset = 000Ch or 0014h]
      2. 7.6.2  GENERAL_CONFIG Register (address = D1h) [reset = 01F0h]
      3. 7.6.3  CONFIG2 Register (address = D2h) [reset = device-specific]
      4. 7.6.4  TRIGGER Register (address = D3h) [reset = 0008h]
      5. 7.6.5  DAC_DATA Register (address = 21h) [reset = 0000h]
      6. 7.6.6  DAC_MARGIN_HIGH Register (address = 25h) [reset = device-specific]
      7. 7.6.7  DAC_MARGIN_LOW Register (address = 26h) [reset =device-specific]
      8. 7.6.8  PMBUS_OPERATION Register (address = 01h) [reset = 0000h]
      9. 7.6.9  PMBUS_STATUS_BYTE Register (address = 78h) [reset = 0000h]
      10. 7.6.10 PMBUS_VERSION Register (address = 98h) [reset = 2200h]
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Power-Supply Margining
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 LED Thermal Foldback
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
        3. 8.2.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Mechanical, Packaging, and Orderable Information

9.5 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.