over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all linearity parameters are measured using 12-bit resolution mode (unless otherwise noted) (1)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
Ej |
Integral linearity error (INL) |
External reference (2) |
External reference (2) |
-2.0 |
|
+2.0 |
LSB |
Ek |
Differential linearity error (DNL) Guaranteed no missing codes |
External reference (2) |
External reference (2) |
-1.0 |
|
+1.0 |
LSB |
EO |
Offset error |
External reference (2) |
-3.5 |
|
3.5 |
mV |
EG |
Gain error |
External reference (2) |
-4 |
|
4 |
LSB |
(1) Total Unadjusted Error (TUE) can be calculated from EI , EO , and EG using the following formula: TUE = √( EI2 + |EO|2 + EG2 )
Note: You must convert all of the errors into the same unit, usually LSB, for the above equation to be accurate
(2) All external reference specifications are measured with VR+ = VREF+ = VDD and VR- = VSS = 0V, external 1uF cap on VREF+ Pin and HW Averaging feature will only be supported since PG2.0.