SLAU916 May   2024

 

  1.   1
  2.   Description
  3.   Getting Started
  4.   Features
  5.   Applications
  6.   6
  7. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
  8. 2Hardware
    1. 2.1 Hardware Setup
      1. 2.1.1 Hardware Theory of Operation
      2. 2.1.2 Jumper Definitions
      3. 2.1.3 Connector Definitions
      4. 2.1.4 Test Points
    2. 2.2 Hardware Overview
      1. 2.2.1 Connecting the FT4232 Digital Controller
      2. 2.2.2 SPI Configuration
      3. 2.2.3 I2C Configuration
      4. 2.2.4 Glitch Testing
  9. 3Software
    1. 3.1 Software Setup
      1. 3.1.1 Software Installation
    2. 3.2 Software Overview
      1. 3.2.1 Launching the Software
    3. 3.3 Software Features
      1. 3.3.1 Low Level Configuration Page
      2. 3.3.2 High Level Configuration Page
  10. 4Hardware Design Files
    1. 4.1 Schematics
    2. 4.2 PCB Layouts
    3. 4.3 Bill of Materials
  11. 5Additional Information
    1. 5.1 Trademarks
  12. 6Related Documentation

2.2.4 Glitch Testing

The DAC80516EVM has dedicated test points for measuring glitch on the OUT15 pin. Test point TP12 and capacitor C36 are isolated from the ground and power plane on the EVM. To best measure glitch, remove R31 to isolate the OUT15 pin from the rest of the EVM circuitry and populate C36 with the desired capacitive load. A probe can be placed across TP12 and TP13. Figure 3-5 shows a glitch measurement taken with the DAC80516EVM. In this example, C36 was populated with a 10pF capacitor and the glitch was captured on the rising edge between codes 0x7FFF to 0x8000.

DAC80516EVM Glitch TestingFigure 2-5 Glitch Testing