SLAZ157J October   2012  – May 2021 MSP430F2101

 

  1. 1Functional Advisories
  2. 2Preprogrammed Software Advisories
  3. 3Debug Only Advisories
  4. 4Fixed by Compiler Advisories
  5. 5Nomenclature, Package Symbolization, and Revision Identification
    1. 5.1 Device Nomenclature
    2. 5.2 Package Markings
      1.      DGV20
      2.      PW20
      3.      DW20
      4.      RGE24
    3. 5.3 Memory-Mapped Hardware Revision (TLV Structure)
  6. 6Advisory Descriptions
    1. 6.1  BCL6
    2. 6.2  BCL8
    3. 6.3  BCL9
    4. 6.4  BCL10
    5. 6.5  BCL11
    6. 6.6  BCL12
    7. 6.7  BCL13
    8. 6.8  BCL14
    9. 6.9  BSL5
    10. 6.10 CPU4
    11. 6.11 CPU5
    12. 6.12 CPU6
    13. 6.13 CPU11
    14. 6.14 CPU12
    15. 6.15 CPU13
    16. 6.16 CPU14
    17. 6.17 CPU19
    18. 6.18 CPU45
    19. 6.19 EEM20
    20. 6.20 FLASH16
    21. 6.21 FLASH17
    22. 6.22 FLASH18
    23. 6.23 FLASH19
    24. 6.24 FLASH20
    25. 6.25 FLASH22
    26. 6.26 FLASH24
    27. 6.27 FLASH27
    28. 6.28 FLASH36
    29. 6.29 JTAG15
    30. 6.30 PORT8
    31. 6.31 PORT10
    32. 6.32 SYS15
    33. 6.33 TA12
    34. 6.34 TA16
    35. 6.35 TA21
    36. 6.36 TAB22
    37. 6.37 XOSC5
    38. 6.38 XOSC8
  7. 7Revision History

FLASH36

FLASH Module

Category

Functional

Function

Flash content may degrade due to aborted page erases

Description

If a page erase is aborted by EEIEX, the flash page containing the last instruction before erase operation will start to degrade. This effect is incremental and, after repetitions, may lead to corrupted flash content.

Workaround

- Use the EEI (interrupted erasing) feature instead of EEIEX (abort erasing).
or
- A PSA checksum can be calculated over affected flash page using the marginal read mode (marginal 0). If PSA sum differs from expected PSA value the affected flash page has to be reprogrammed.
or
- Start flash erasing from RAM and limit system frequency to <1MHz (to ensure 6-us delay after EEIEX).  If the last instruction before erasing is located in RAM, flash cell degradation does not occur.