SLLA470A April 2020 – October 2020 TLIN1028S-Q1

3 Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the TLIN10283S-Q1 and TLIN10285S-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Pin short-circuited to Ground (see Table 3-2)
Pin open-circuited (see Table 3-3)
Pin short-circuited to an adjacent pin (see Table 3-4)
Pin short-circuited to V_SUP (see Table 3-5)
Pin short-circuited to V_CC (see Table 3-6)

Table 3-2 through Table 3-6 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 3-1.

Table 3-1 TI Classification of Failure Effects

Class	Failure Effects
A	Potential device damage that affects functionality
B	No device damage, but loss of functionality
C	No device damage, but performance degradation
D	No device damage, no impact to functionality or performance

Figure 3-1 shows the TLIN10283S-Q1 and TLIN10285S-Q1 pin diagram. For a detailed description of the device pins please refer to the 'Pin Configuration and Functions' section in the TLIN10283S-Q1 and TLIN10285S-Q1 datasheet.

Figure 3-1 Pin Diagram

Following are the assumptions of use and the device configuration assumed for the Pin FMA in this section:

All conditions within recommended operating conditions.
V_CC = 4.9 to 5.1 V for TLIN10285S-Q1
V_CC = 3.23 to 3.37 V for TLIN10283S-Q1
V_SUP = see recommended operating conditions in device data sheet

Table 3-2 Pin FMA for Device Pins Short-Circuited to Ground

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
V_SUP	1	Device is unpowered and will not function	A
EN	2	Device may only operate in Standby mode after power-on. If the short occurs in Normal mode, the part would then be forced to enter SLP (TXD=dominant) or STBY (TXD=recessive) based on the state of TXD when the shorting occurred. The short to GND condition would disable LIN communication.	B
GND	3	None	D
LIN	4	LIN bus biased dominant, no LIN communication possible	B
RXD	5	RXD biased dominant, no communication from LIN bus to MCU possible	B
TXD	6	TXD biased dominant, no communication from MCU to LIN possible	B
nRST	7	nRST biased low causing the MCU to be in reset if connected in this manner	B
V_CC	8	Excessive current draw from V_CC. Thermal shut down will happen quickly.	A

Table 3-3 Pin FMA for Device Pins Open-Circuited

Pin Name	Pin No.	Excess	Failure Effect Class
V_SUP	1	Device is unpowered and will not function	B
EN	2	Biased low due to internal pull-down so device in standby mode	B
GND	3	Device is unpowered and will not function	B
LIN	4	No LIN communication possible	B
RXD	5	No communication from LIN bus to MCU possible	B
TXD	6	No communication from MCU to LIN bus possible	B
nRST	7	No nRST output to MCU indicating a UV_CC event	C
V_CC	8	LDO unable to power external circuits	C

Table 3-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin

Pin Name	Pin No.	Shorted to	Description of Potential Failure Effect(s)	Failure Effect Class
V_SUP	1	EN	EN pin absolute max will be exceeded	A
EN	2	GND	EN biased to ground. See EN shorted to GND	B
GND	3	LIN	LIN biased dominant. See LIN shorted to GND	B
RXD	5	TXD	Communication between MCU and LIN bus disrupted	B
TXD	6	nRST	TXD biased recessive unless UV_CC event and then biased dominant, MCU to LIN bus communication not possiblen	B
nRST	7	V_CC	nRST internally connected to V_CC but a UV_CC event may not be provided to MCU in timely manner	C

Table 3-5 Pin FMA for Device Pins Short-Circuited to V_SUP

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
EN	2	Absolute max voltage exceeded	A
GND	3	Device will not function	A
LIN	4	Device biased recessive, no bus communication possible	B
RXD	5	Absolute max voltage exceeded	A
TXD	6	Absolute max voltage exceeded	A
nRST	7	Absolute max voltage exceeded	A
V_CC	8	Absolute max voltage exceeded	A

Table 3-6 Pin FMA for Device Pins Short-Circuited to V_CC

Pin Name	Pin No.	Description of Potential Failure Effect(s)	Failure Effect Class
V_SUP	1	Absolute max voltage exceeded on V_CC	A
EN	2	EN biased high, mode change may not be possible	B
GND	3	Device will not function	A
LIN	4	Absolute max voltage exceeded on V_CC, no bus communication	A
RXD	5	RXD biased recessive, no communication from LIN bus to MCU	B
TXD	6	TXD biased recessive, no communication from MCU to LIN bus	B
nRST	7	None - internally biased to V_CC	D