SLLA475 December   2020 TCAN1144-Q1 , TCAN1146-Q1

 

  1. 1TCAN1144-Q1 and TCAN1146-Q1 Functional Safety Manual
  2. 2Trademarks
  3. 3Introduction
  4. 4TCAN114x-Q1 Hardware Component Functional Safety Capability
  5. 5Development Process for Management of Systematic Faults
    1. 5.1 TI New-Product Development Process
  6. 6TCAN1144-Q1 and TCAN1146-Q1 Component Overview
    1. 6.1 Targeted Applications
    2. 6.2 Hardware Component Functional Safety Concept
    3. 6.3 Functional Safety Constraints and Assumptions
  7. 7Description of Hardware Component Parts
    1. 7.1 CAN Transceiver
    2. 7.2 Digital Core
    3. 7.3 EEPROM
    4. 7.4 Power Control IP
      1. 7.4.1 Voltage Monitors
    5. 7.5 Thermal Shut Down
    6. 7.6 Digital Input/Outputs
  8. 8TCAN1144-Q1 and TCAN1146-Q1 Management of Random Faults
    1. 8.1 Fault Reporting
    2. 8.2 Functional Safety Mechanism Categories
    3. 8.3 Description of Functional Safety Mechanisms
      1. 8.3.1 CAN Communication
        1. 8.3.1.1 SM-1: CAN bus fault diagnostic
        2. 8.3.1.2 SM-2: Thermal shutdown; TSD
        3. 8.3.1.3 SM-3: CAN bus short circuit limiter, IOS
        4. 8.3.1.4 SM-4: CAN TXD pin dominant state timeout; tTXD_DTO
        5. 8.3.1.5 SM-17: CAN protocol
      2. 8.3.2 Supply Voltage Rail Monitoring
        1. 8.3.2.1 SM-5: VCC undervoltage; UVCC
        2. 8.3.2.2 SM-6: VSUP supply undervoltage; UVSUP
        3. 8.3.2.3 SM-7: VIO supply undervoltage; UVIO
      3. 8.3.3 SPI/Processor Communication
        1. 8.3.3.1 SM-8: Timout, Window or Q&A watchdog error - Normal mode
        2. 8.3.3.2 SM-9: SPI communication error; SPIERR
        3. 8.3.3.3 SM-10: Scratchpad write/read
        4. 8.3.3.4 SM-11: Sleep Wake Error Timer; tINACTIVE
      4. 8.3.4 Device Internal EEPROM
        1. 8.3.4.1 SM-12: Internal memory CRC; CRC_EEPROM
      5. 8.3.5 Floating Pins
        1. 8.3.5.1 SM-13: SCLK internal pull-up to VIO
        2. 8.3.5.2 SM-14: SDI internal pull-up to VIO
        3. 8.3.5.3 SM-15: nCS internal pull-up to VIO
        4. 8.3.5.4 SM-16: TXD internal pull-up to VIO
          1.        B Revision History

7.3 EEPROM

The TCAN1144-Q1 and TCAN1146-Q1 have an internal EEPROM memory for storing device trim selections. This EEPROM is programmed in a test only mode utilizing an internal charge pump and is monitored with a CRC check by the digital core of the device.