This report discusses the radiation characterization results of the THVD9491-SEP fault-protected full-duplex RS-422/RS-485 transceiver. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 30krad(Si) as a one-time characterization. The results show that all samples passed within the specified limits up to 30krad(Si). Radiation Lot Acceptance Testing (RLAT) will be performed using 5 units at a dose level of 30krad(Si) per MIL-STD-883 TM 1019. All future wafer lots will be tested under the same conditions.
The THVD9491-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm2 / mg, which makes the device an option for low Earth orbit space applications.