SLLSEL2C September 2015 – July 2016 SN65DP149 , SN75DP149
PRODUCTION DATA.
MIN | MAX | UNIT | ||
---|---|---|---|---|
Supply voltage(3) | VCC | –0.3 | 4 | V |
VDD | –0.3 | 1.4 | V | |
Voltage | Main link input (IN_Dx AC-coupled mode) | 1.56 | V | |
TMDS outputs ( OUT_Dx) | –0.3 | 4 | V | |
HPD_SRC, Vsadj, SDA_CTL, SCL_CTL, OE, HDMI_SEL/A1, EQ_SEL/A0, I2C_EN/PIN, SLEW_CTL, SDA_SRC, SCL_SRC | –0.3 | 4 | V | |
HPD_SNK, SDA_SNK, SCL_SNK | –0.3 | 6 | V | |
Continuous power dissipation | See Thermal Information | |||
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) | ±2000 | V |
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) | ±500 | V |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
GENERAL PARAMETERS | ||||||
VCC | Supply voltage | 3 | 3.3 | 3.6 | V | |
VDD | 1.00 | 1.1 | 1.27 | |||
TCASE | Case temperature for RSB package | 93.5 | °C | |||
TA | Operating free-air temperature | SN75DP149 | 0 | 85 | °C | |
SN65DP149 | –40 | 85 | ||||
MAIN LINK DIFFERENTIAL PINS | ||||||
VID_PP | Peak-to-peak input differential voltage | 75 | 1200 | mv | ||
VIC | Input common mode voltage | 0 | 2 | V | ||
CAC | AC coupling capacitance | 75 | 100 | 200 | nF | |
dR | Data rate | 0.25 | 5 | Gbps | ||
Vsadj | TMDS-compliant swing voltage bias resistor | 6.5 | kΩ | |||
CONTROL PINS | ||||||
VI-DC | DC input voltage | –0.3 | 3.6 | V | ||
VIL(1) | Low-level input voltage at OE | 0.8 | V | |||
Low-level input voltage at SLEW_CTL, PRE_SEL, EQ_SEL/A0, SWAP/POL | 0.3 | |||||
VIM(1) | No connect input voltage at SLEW_CTL, PRE_SEL, EQ_SEL/A0, SWAP/POL | 1 | 1.2 | 1.4 | V | |
VIH(1) | High-level input voltage at SLEW_CTL, OE(2) , PRE_SEL, EQ_SEL/A0, SWAP/POL | 2.6 | V | |||
VOL | Low-level output voltage | 0.4 | V | |||
VOH | High-level output voltage | 2.4 | V | |||
IIH | High-level input current | –30 | 30 | µA | ||
IIL | Low-level input current | –10 | 10 | µA | ||
IOS | Short circuit output current | –50 | 50 | mA | ||
IOZ | High impedance output current | 10 | µA | |||
ROEPU | Pullup resistance on OE pin | 150 | 250 | kΩ |
THERMAL METRIC(1) | SNx5DP149 | UNIT | |
---|---|---|---|
RSB (WQFN) | |||
40 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 37.3 | °C/W |
RθJB | Junction-to-board thermal resistance (High-K board(2)) | 9.9 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance (High-K board(2)) | 23.1 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 3.2 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.3 | °C/W |
ψJB | Junction-to-case (bottom) thermal resistance | 3.2 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP(1) | MAX | UNIT | |
---|---|---|---|---|---|---|
PD1 | Device power dissipation (retimer mode) | OE = H, HDMI_SEL = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ IN_Dx: VID_PP = 1200-mV, 3.4-Gbps TMDS pattern AUX: VI = 3.3-V I2C_EN/PIN = L, PRE_SEL= H, IN_EQ_CTL= H, SDA_CTL/CLK_CTL = 0-V |
390 | 510 | mW | |
PD2 | Device power dissipation (redriver mode) | OE = H, HDMI_SEL = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ IN_Dx: VID_PP = 1200-mV, 3.4-Gbps TMDS pattern AUX: VI = 3.3-V I2C_EN/PIN = L, PRE_SEL= H, IN_EQ_CTL= H, SDA_CTL/CLK_CTL = 0-V |
225 | 350 | mW | |
PSD1 | Device power with shut down OE = L | OE = L, VCC = 3.3/3.6 V, VDD = 1.1/1.27 V, VSadj = 7.06 kΩ | 5 | 15 | mW | |
IDD1 | VDD Supply current (TMDS 3.4-Gpbs retimer mode) | OE = H, HDMI_SEL = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ IN_Dx: VID_PP = 1200-mV, 3.4-Gbps TMDS pattern AUX: VI = 3.3-V, 100-kHz PRBS I2C_EN/PIN = L, PRE_SEL = H, IN_EQ_CTL = H, SDA_CTL/CLK_CTL = 0 V, SLEW_CTL = H |
250 | 300 | mA | |
ICC1 | VCC Supply current (TMDS 3.4-Gpbs retimer mode) | OE = H, HDMI_SEL = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ IN_Dx: VID_PP = 1200-mV, 3.4-Gbps TMDS pattern AUX: VI = 3.3-V, 100-kHz PRBS I2C_EN/PIN = L, PRE_SEL = H, IN_EQ_CTL = H, SDA_CTL/CLK_CTL = 0 V, SLEW_CTL = H |
35 | 50 | mA | |
IDD2 | VDD Supply current (TMDS 3.4-Gpbs redriver mode) | OE = H, HDMI_SEL = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ IN_Dx: VID_PP = 1200-mV, 3.4-Gbps TMDS pattern AUX: VI = 3.3-V, 100-kHz PRBS I2C_EN/PIN = L, PRE_SEL = H, IN_EQ_CTL = H, SDA_CTL/CLK_CTL = 0 V, SLEW_CTL = H |
170 | 200 | mA | |
ICC2 | VCC Supply current (TMDS 3.4-Gpbs redriver mode) | OE = H, HDMI_SEL = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ IN_Dx: VID_PP = 1200-mV, 3.4-Gbps TMDS pattern AUX: VI = 3.3-V, 100-kHz PRBS I2C_EN/PIN = L, PRE_SEL = H, IN_EQ_CTL = H, SDA_CTL/CLK_CTL = 0 V, SLEW_CTL = H |
8 | 20 | mA | |
ISD1 | VDD Shutdown current | OE = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ | 3 | 10.5 | mA | |
ISD1 | VCC Shutdown current | OE = L, VCC = 3.3/3.6-V, VDD = 1.1/1.27-V, VSadj = 6.5-kΩ | 2 | 5 | mA |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
DR_RX_DATA | Ddata lanes data rate | 0.25 | 3.4 | Gbps | ||
DR_RX_CLK | Clock lanes clock rate | 25 | 340 | MHz | ||
tRX_DUTY | Input clock duty circle | 40% | 50% | 60% | ||
tCLK_JIT | Input clock jitter tolerance | 0.3 | Tbit | |||
tDATA_JIT | Input data jitter tolerance | Test the TTP2, see Figure 7 | 150 | ps | ||
TRX_INTRA | Input intra-pair skew tolerance | Test at TTP2 when DR = 1.6-Gbps, see Figure 7 | 112 | ps | ||
TRX_INTER | Input inter-pair skew tolerance | 1.8 | ns | |||
EQH(D) | Fixed EQ gain for data lane IN_D(0,1,2)n/p | EQ_SEL/A0 = H; Fixed EQ gain, test at 3.4-Gbps |
14 | dB | ||
EQL(D) | Fixed EQ gain for data lane IN_D(0,1,2)n/p | EQ_SEL/A0 = L; Fixed EQ gain, test at 3.4-Gbps |
7.5 | dB | ||
EQZ(D) | Adaptive EQ gain for data lane IN_D(0,1,2)n/p | EQ_SEL/A0 = Z; adaptive EQ | 2 | 14 | dB | |
EQ(c) | EQ gain for clock lane IN_CLKn/p | EQ_SEL/A0 = H,L,NC | 3 | |||
RINT | Input differential termination impedance | 80 | 100 | 120 | Ω | |
VITERM | Input termination voltage | OE = H | 0.7 | V | ||
VID_PP | Input differential voltage (peak to peak) | Tested at TTP2, check Figure 7 | 75 | 1200 | mVPP |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VOH | Single-ended high level output voltage | Data rate ≤ 1.65 Gbps; PRE_SEL = NC; SLEW_CTL = H; OE = H; DR = 750 Mbps, VSadj = 7.06 kΩ | VCC – 10 | VCC + 10 | mV | |
1.65 Gbps < Data rate ≤ 3.4 Gbps; PRE_SEL = NC; SLEW_CTL = H; OE = H; DR = 2.97 Gbps, VSadj = 7.06 kΩ | VCC – 200 | VCC + 10 | ||||
VOL | Single-ended low level output voltage | Data rate ≤ 1.65 Gbps; PRE_SEL = NC; SLEW_CTL = H; OE = H; DR = 750 Mbps, VSadj = 6.5 kΩ | VCC – 600 | VCC – 400 | mV | |
1.65-Gbps < Data rate ≤ 3.4-Gbps; PRE_SEL = NC; SLEW_CTL = H; OE = H; DR = 2.97-Gbps, VSadj = 6.5 kΩ | VCC – 700 | VCC – 400 | ||||
VSWING_DA | Single-ended output voltage swing on data lane | PRE_SEL = NC; SLEW_CTL = H; OE = H; DR = 270-Mbs/2.97 VSadj = 6.5 kΩ | 400 | 500 | 600 | mV |
VSWING_CLK | Single-ended output voltage swing on clock lane | Data rate ≤ 3.4-Gbps; PRE_SEL = NC; SLEW_CTL = H; OE = H; VSadj = 6.5 kΩ | 400 | 500 | 600 | mV |
ΔVSWING | Change in single-end output voltage swing per 100 Ω ΔVsadj | 20 | mV | |||
ΔVOCM(SS) | Change in steady state output common mode voltage between logic levels | –5 | 5 | mV | ||
VOD(PP) | Output differential voltage before pre-emphasis | Vsadj = 7.06 kΩ; PRE_SEL = Z, See Figure 5 | 800 | 1200 | mV | |
VOD(SS) | Steady-state output differential voltage | Vsadj = 7.06 kΩ; PRE_SEL = L, See Figure 6 | 600 | 1050 | mV | |
ILEAK | Failsafe condition leakage current | VCC = 0 V; VDD = 0-V; output pulled to 3.3 V through 50-Ω resistors | 45 | µA | ||
IOS | Short circuit current limit | Main link output shorted to GND | 50 | mA | ||
RTERM | Source termination resistance for HDMI 2.0 | 75 | 150 | Ω |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VI-DC | SCL/SDA_SNK DC input voltage | –0.3 | 5.6 | V | ||
SCL/SDA_CTL, SCL/SDA_SRC DC input voltage | –0.3 | 3.6 | V | |||
VIL | SCL/SDA_SNK, SCL/SDA_SRC Low level input voltage | 0.3 xVCC | V | |||
SCL/SDA_CTL Low level input voltage | 0.3 x VCC | V | ||||
VIH | SCL/SDA_SNK high level input voltage | 3 | V | |||
SCL/SDA_SRC high level input voltage | 0.7 x VCC | V | ||||
SCL/SDA_CTL high level input voltage | 0.7 x VCC | V | ||||
VOL | SCL/SDA_CTL, SCL/SDA_SRC low-level output voltage | I0 = 3 mA and VCC > 2-V | 0.4 | V | ||
I0 = 3 mA and VCC < 2-V | 0.2 x VCC | V | ||||
fSCL | SCL clock frequency fast I2C mode for local I2C control | 400 | kHz | |||
Cbus | Total capacitive load for each bus line (DDC and local I2C pins) | 400 | pF |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VIH | High-level input voltage | HPD_SNK | 2.1 | V | ||
VIL | Low-level input voltage | HPD_SNK | 0.8 | V | ||
VOH | High-level output voltage | IOH = –50 µA; HPD_SRC | 2.4 | 3.6 | V | |
VOL | Low-level output voltage | IOL = 500 µA; HPD_SRC | 0 | 0.1 | V | |
ILEAK | Failsafe condition leakage current | VCC = 0 V; VDD = 0 V; HPD_SNK = 5 V | 40 | μA | ||
IH_HPD | High-level input current | Device powered; VIH = 5 V; IH_HPD includes RpdHPD resistor current |
40 | μA | ||
IL_HPD | Low-level input current | Device powered; VIL = 0.8 V; IL_HPD includes RpdHPD resistor current |
30 | |||
RpdHPD | HPD input termination to GND | VCC = 0 V | 150 | 190 | 220 | kΩ |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
REDRIVER MODE | ||||||
DR | Data rate (Automatic Mode) | 250 | 1000 | Mbps | ||
DR | Data rate (full redriver mode) | 250 | 3400 | Mbps | ||
tPLH | Propagation delay time (low to high) | 250 | 600 | ps | ||
tPHL | Propagation delay time (high to low) | 250 | 800 | ps | ||
tT1 | Transition time (rise and fall time); measured at 20% and 80% levels for data lanes. TMDS clock meets tT3 for all three times. | SLEW_CTL = H; PRE_SEL = NC; OE = H; DR = 2.97 Gbps | 75 | ps | ||
tT2 | SLEW_CTL = L; PRE_SEL = NC; OE = H; DR = 2.97 Gbps | 75 | ||||
tT3 | SLEW_CTL = NC; PRE_SEL = NC; OE = H; DR = 2.97 Gbps; CLK 297MHz | 100 | ||||
tSK1(T) | Intra-pair output skew | SLEW_CTL = NC; PRE_SEL = NC; OE = H; DR = 2.97 Gbps; | 40 | ps | ||
tSK2(T) | Inter-pair output skew | SLEW_CTL = NC; PRE_SEL = NC; OE = H; DR = 2.97 Gbps; | 100 | |||
tJITD1 | Total output data jitter | DR = 2.97 Gbps, HDMI_SEL/A1 = NC, EQ_SEL/A0 = NC; PRE_SEL = NC; SLEW_CTL = H OE = H. See Figure 7 at TTP3 |
0.2 | Tbit | ||
tJITC1 | Total output clock jitter | CLK = 297 MHz | 0.25 | Tbit | ||
RETIMER MODE | ||||||
dR | Data rate (Full retimer mode) | 0.25 | 3.4 | Gbps | ||
dR | Data rate (Automatic mode) | 1.0 | 3.4 | Gbps | ||
dXVR | Automatic redriver to retimer crossover | Measured with input signal applied from 0 to 200 mVpp | .75 | 1.0 | 1.25 | Gbps |
fCROSSOVER | Crossover frequency hysteresis | 250 | MHz | |||
PLLBW | Data retimer PLL bandwidth | Default loop bandwidth setting | .4 | 1 | MHz | |
tACQ | Input clock frequency detection and retimer acquisition time | 180 | μs | |||
IJT1 | Input clock jitter tolerance | Tested when data rate > 1.0 Gbps | 0.3 | Tbit | ||
tT1 | Transition time (rise and fall time); measured at 20% and 80% levels for data lanes. TMDS clock meets tT3 for all three times. | SLEW_CTL = H; PRE_SEL = NC; OE = H; DR = 3.4 Gbps | 75 | ps | ||
tT2 | SLEW_CTL = L; PRE_SEL = NC; OE = H; DR = 3.4 Gbps | 75 | ||||
tT3 | SLEW_CTL = NC; PRE_SEL = NC; OE = H; DR = 3.4 Gbps; CLK = 297 MHz | 100 | ||||
tDCD | OUT_CLK ± duty cycle | 40% | 50% | 60% | ||
tSK_INTER | Inter-pair output skew | Default setting for internal inter-pair skew adjust, HDMI_SEL/A1 = NC | 0.2 | Tch | ||
tSK_INTRA | 0.15 | Tbit | ||||
tJITC1(1.4b) | Total output clock jitter | CLK = 297 MHz | 0.25 | Tbit |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tPD(HPD) | Propagation delay from HPD_SNK to HPD_SRC; rising edge and falling edge | See Figure 10; not valid during switching time | 40 | 120 | ns | |
tT(HPD) | HPD logical disconnected timeout | See Figure 11 | 2 | ms |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tr | Rise time of both SDA and SCL signals | Vcc = 3.3-V | 300 | ns | ||
tf | Fall time of both SDA and SCL signals | 300 | ns | |||
tHIGH | Pulse duration, SCL high | 0.6 | μs | |||
tLOW | Pulse duration, SCL low | 1.3 | μs | |||
tSU1 | Setup time, SDA to SCL | 100 | ns | |||
tST, STA | Setup time, SCL to start condition | 0.6 | μs | |||
tHD,STA | Hold time, start condition to SCL | 0.6 | μs | |||
tST,STO | Setup time, SCL to stop condition | 0.6 | μs | |||
t(BUF) | Bus free time between stop and start condition. | 1.3 | μs | |||
tPLH1 | Propagation delay time, low-to-high-level output | Source-to-sink: 100-kbps pattern; Cb(Sink) = 400-pF(1); See Figure 14 |
360 | ns | ||
tPHL1 | Propagation delay time, high-to-low-level output | 230 | ns | |||
tPLH2 | Propagation delay time, low-to-high-level output | Sink to Source: 100-kbps pattern; Cb(Source) = 100-pF(1); See Figure 15 |
250 | ns | ||
tPHL2 | Propagation delay time, high-to-low-level output | 200 | ns |