SLOK014A November   2018  – August 2024 TLV1704-SEP

 

  1.   1
  2.   TLV1704-SEP Single-Event Effects (SEE) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
  9. 6Summary
  10. 7SET Results Appendix
  11. 8Confidence Interval Calculations
  12.   References
  13.   B Revision History

Abstract

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the TLV1704-SEP 2.2V to 24V, microPower comparator. Heavy-ions with an LETEFF of 43MeV-cm2/ mg were used to irradiate the devices with a fluence of 1 × 107 ions/cm2. The results demonstrate that the TLV1704-SEP is SEL-free up to LETEFF = 43MeV-cm2/ mg at 125°C. Characterization of single-event transients (SET) was also performed, up to a surface LETEFF = 50MeV-cm2 / mg at 125°C.