SLOK014A November   2018  – August 2024 TLV1704-SEP

 

  1.   1
  2.   TLV1704-SEP Single-Event Effects (SEE) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
  9. 6Summary
  10. 7SET Results Appendix
  11. 8Confidence Interval Calculations
  12.   References
  13.   B Revision History

SEE Mechanisms

The primary single-event effect (SEE) events of interest in the TLV1704-SEP are single-event latch-up (SEL). From a risk/impact point-of-view, the occurrence of an SEL is potentially the most destructive SEE event and the biggest concern for space applications. The BICOM3XHV was used for the TLV1704-SEP. CMOS circuitry introduces a potential for SEL and SEB susceptibility. SEL can occur if excess current injection caused by the passage of an energetic ion is high enough to trigger the formation of a parasitic cross-coupled PNP and NPN bipolar structure (formed between the p-sub and n-well and n+ and p+ contacts). The parasitic bipolar structure initiated by a single-event creates a high-conductance path (inducing a steady-state current that is typically orders-of-magnitude higher than the normal operating current) between power and ground that persists (is “latched”) until power is removed or until the device is destroyed by the high-current state. The process modifications applied for SEL-mitigation were sufficient as the TLV1704-SEP exhibited no SEL with heavy-ions up to an LETEFF of 43 MeV-cm2/mg at a fluence of 107 ions/cm2 and a chip temperature of 125°C.

This study was performed to evaluate the SEL effects with a bias voltage of 24V on VS Supply Voltage. Heavy ions with LETEFF = 43 MeV-cm2/mg were used to irradiate the devices. Flux of 105 ions/s-cm2 and fluence of 107 ions were used during the exposure at 125°C temperature.

 Functional Block Diagram of the TLV1704-SEPFigure 2-1 Functional Block Diagram of the TLV1704-SEP