SLOK014A November   2018  – August 2024 TLV1704-SEP

 

  1.   1
  2.   TLV1704-SEP Single-Event Effects (SEE) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
  9. 6Summary
  10. 7SET Results Appendix
  11. 8Confidence Interval Calculations
  12.   References
  13.   B Revision History

1 Overview

The TLV1704-SEP (Quad) device offers a wide supply range, rail-to-rail inputs, low quiescent current, and low propagation delay. All these features come in industry-standard, extremely-small packages, making these devices the best general-purpose comparators available. The open collector output offers the advantage of allowing the output to be pulled to any voltage rail up to +24 V above the negative power supply regardless of the TLV1704-SEP supply voltage. The device is a microPower comparator. Low input offset voltage, low input bias currents, low supply current, and open-collector configuration makes the TLV1704-SEP device flexible enough to handle almost any application, from simple voltage detection to driving a single relay.

www.ti.com/product/TLV1704-SEP/technicaldocuments

Table 1-1 Overview Information
DESCRIPTIONDEVICE INFORMATION
TI Part NumberTLV1704-SEP
MLS NumberTLV1704AMPWTPSEP
Device FunctionRadiation Hardened microPower Quad Comparator in Space Enhanced Plastic
TechnologyBICOM3XHV
Exposure FacilityFacility for Rare Isotope Beams, Michigan State University
Heavy Ion Fluence per Run1×107 ions/cm2
Irradiation Temperature125°C (for SEL testing)