SLOK014A November 2018 – August 2024 TLV1704-SEP
5.1 Single Event Latchup (SEL) Results
During SEL characterization, the device was heated using forced hot air, maintaining the IC temperature at 125°C. The temperature was monitored by means of a thermal camera. The species used for the SEL testing was a Xenon (129 Xe) ion with an angle-of-incidence of 0° for an LETEFF = 50.5 MeV-cm2/mg. A flux of approximately 105 ions/cm2-s and a fluence of approximately 107 ions were used each run. The Vs supply voltage is supplied externally on board at recommended maximum voltage setting of 24V. Run duration to achieve this fluence was approximately less than 2 minutes. Three devices were tested at an output low condition where each device had a total of two runs.
| RUN # | DUT | DISTANCE (mm) | TEMPERATURE (°C) | ION | ANGLE (°) | FLUX (ions·cm2/mg) | FLUENCE (# ions) | LETEFF (MeV.cm2/mg) |
|---|---|---|---|---|---|---|---|---|
| 24 | 3 | 70 | 125 | Xe | 0 | 1.00E+05 | 1.00E+07 | 50.5 |
25 | 3 | 70 | 125 | Xe | 0 | 1.00E+05 | 1.00E+07 | 50.5 |
76 | 7 | 70 | 125 | Xe | 0 | 0.997E+05 | 1.00E+07 | 50.5 |
77 | 7 | 70 | 125 | Xe | 0 | 1.01E+05 | 1.00E+07 | 50.5 |
82 | 8 | 70 | 125 | Xe | 0 | 1.01E+05 | 1.00E+07 | 50.5 |
83 | 8 | 70 | 125 | Xe | 0 | 1.01E+05 | 1.00E+07 | 50.5 |
No SEL events were observed, indicating that the TLV1704-SEP is SEL-immune at LETEFF = 43 MeV-cm2/mg and T = 125°C. Using the MFTF method described in Section 8 and combining (or summing) the fluences of the two runs @ 125°C (2 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:
σSEL ≤ 1.84 × 10–7 cm2 for LETEFF = 43 MeV-cm2/mg and T = 125°C.
Figure 5-1 Run #24: DUT3 Supply Current vs. Time
Figure 5-3 Run #76: DUT7 Supply Current vs. Time
Figure 5-2 Run #25: DUT3 Supply Current vs. Time
Figure 5-4 Run #77: DUT7 Supply Current vs. Time