SLOK014A
November 2018 – August 2024
TLV1704-SEP
1
TLV1704-SEP Single-Event Effects (SEE) Radiation Report
Trademarks
1
Overview
2
SEE Mechanisms
3
Test Device and Test Board Information
4
Irradiation Facility and Setup
5
Results
5.1
Single Event Latchup (SEL) Results
5.2
Single Event Transient (SET) Results
6
Summary
7
SET Results Appendix
8
Confidence Interval Calculations
References
B Revision History
Abstract
(1)
D. Kececioglu, “Reliability and Life Testing Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186-193.