SLUAAD4 February 2021 BQ76952 , BQ76972
While TI cannot warranty device operation beyond specified datasheet limits, an experiment was performed to expose selected high voltage pins of set of 35 devices to a 120 V level at a temperature of 85°C. Pertinent parametric data was collected on each device before and after the stress was applied, with results and changes in parameters described by device.
In evaluating the resulting data, no systemic changes were observed pre-stress to post-stress, with errors remaining within specifications. No analysis was performed to ascertain the effect of the stress on long term device reliability. This data should not be interpreted to assume that all devices will exhibit similar results when exposed to similar conditions. TI recommends customers operate devices only within conditions as specified in the production datasheet.