SLUAAH0 February 2022 UCC14130-Q1 , UCC14131-Q1 , UCC14140-Q1 , UCC14141-Q1 , UCC14240-Q1 , UCC14241-Q1 , UCC14340-Q1 , UCC14341-Q1 , UCC15240-Q1 , UCC15241-Q1
The UCC14240-Q1 data sheet (section 6.4) specifies traditional thermal resistance parameters based on joint electron device engineering council (JEDEC) test standards used to derive RΘJA and RΘJC for a single die semiconductor package. The junction-to-ambient thermal resistance, RΘJA, is most often assumed valid for determining the junction temperature, TJ, as:
Where TA is the ambient temperature, RΘJA, is the junction-to-ambient thermal resistance found in the UCC14240-Q1 data sheet and PD is the power dissipation determined from the UCC14240-Q1 efficiency curves, also published in the data sheet. The problem with this approach is that RΘJA is determined based on the JEDEC PCB design standard for a given IC package. The derivation of RΘJA carries strong dependence upon chip size, pad size, environmental conditions and PCB design of copper pours, copper thickness, etc. The PCB used in a traction inverter, will most assuredly be nothing like the JEDEC PCB used to characterize RΘJA.
As a method for determining TJ based on measuring case temperature, TC, and knowing the total power dissipation, RΘJC, is commonly used as:
Using TC to determine TJ is valid when it can be assumed that the dissipated power converts heat to energy that is mostly radiated off the top surface of a plastic IC package. The TJ measurement technique is useful for legacy or military metallic packages or packages with metal top side cooling. However, inaccuracies are unavoidable when applying RΘJC to plastic packages. The UCC14240-Q1 is designed to extract heat through the package lead frame to the PCB introducing further discrepancies to the assumption that heat energy generated from inside the package is accurately represented by measuring the top side surface temperature, TC.