SLUAAT6 July   2024 BQ41Z50

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Manufacture Testing
  5. 2Calibration
    1. 2.1 Cell Voltage Calibration
    2. 2.2 BAT Voltage Calibration
    3. 2.3 PACK Voltage Calibration
    4. 2.4 Current Calibration
      1. 2.4.1 CC Offset Calibration
      2. 2.4.2 Board Offset Calibration
      3. 2.4.3 CC Gain Calibration
    5. 2.5 Temperature Calibration
      1. 2.5.1 Internal Temperature Sensor Calibration
      2. 2.5.2 TS1–TS2–TS3–TS4 Calibration
  6. 3References

1 Manufacture Testing

To improve the manufacture testing flow, the gas gauge device allows certain features to be toggled on or off through ManufacturerAccess() commands. For example, the PRE-CHG FET(), CHG FET(), DS FET(), Lifetime Data Collection(), Calibration() features. Enabling only the feature under test can simplify the test flow in production by avoiding any feature interference. These toggling commands only set the RAM data, meaning the conditions set by the these commands are cleared if a reset or seal is issued to the gauge. The ManufacturingStatus() keeps track of the status (enabled or disabled) of each feature.

The data flash ManufacturingStatus provides the option to enable or disable individual features for normal operation. Upon a reset or a seal command, the ManufacturingStatus() is re-loaded from data flash ManufacturingStatus(). This also means if an update is made to ManufacturingStatus() to enable or disable a feature, the gauge only takes the new setting if a reset or seal command is sent.