SLUS458I July   2000  – June 2024 UCC28C40 , UCC28C41 , UCC28C42 , UCC28C43 , UCC28C44 , UCC28C45 , UCC38C40 , UCC38C41 , UCC38C42 , UCC38C43 , UCC38C44 , UCC38C45

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Detailed Pin Description
        1. 7.3.1.1 COMP
        2. 7.3.1.2 FB
        3. 7.3.1.3 CS
        4. 7.3.1.4 RT/CT
        5. 7.3.1.5 GND
        6. 7.3.1.6 OUT
        7. 7.3.1.7 VDD
        8. 7.3.1.8 VREF
      2. 7.3.2  Undervoltage Lockout
      3. 7.3.3  ±1% Internal Reference Voltage
      4. 7.3.4  Current Sense and Overcurrent Limit
      5. 7.3.5  Reduced-Discharge Current Variation
      6. 7.3.6  Oscillator Synchronization
      7. 7.3.7  Soft-Start Timing
      8. 7.3.8  Enable and Disable
      9. 7.3.9  Slope Compensation
      10. 7.3.10 Voltage Mode
    4. 7.4 Device Functional Modes
      1. 7.4.1 Normal Operation
      2. 7.4.2 UVLO Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1  Input Bulk Capacitor and Minimum Bulk Voltage
        2. 8.2.2.2  Transformer Turns Ratio and Maximum Duty Cycle
        3. 8.2.2.3  Transformer Inductance and Peak Currents
        4. 8.2.2.4  Output Capacitor
        5. 8.2.2.5  Current Sensing Network
        6. 8.2.2.6  Gate Drive Resistor
        7. 8.2.2.7  VREF Capacitor
        8. 8.2.2.8  RT/CT
        9. 8.2.2.9  Start-Up Circuit
        10. 8.2.2.10 Voltage Feedback Compensation
          1. 8.2.2.10.1 Power Stage Poles and Zeroes
          2. 8.2.2.10.2 Slope Compensation
          3. 8.2.2.10.3 Open-Loop Gain
          4. 8.2.2.10.4 Compensation Loop
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
        1. 8.4.1.1 Precautions
        2. 8.4.1.2 Feedback Traces
        3. 8.4.1.3 Bypass Capacitors
        4. 8.4.1.4 Compensation Components
        5. 8.4.1.5 Traces and Ground Planes
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Third-Party Products Disclaimer
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

9.6 Electrostatic Discharge Caution

UCC28C40 UCC28C41 UCC28C42 UCC28C43 UCC28C44 UCC28C45 UCC38C40 UCC38C41 UCC38C42 UCC38C43 UCC38C44 UCC38C45 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.