4 Revision History
Changes from Revision B (December 2019) to Revision C (January 2023)
- Added Safety-related certifications to FeaturesGo
- Added what to do with unused pins to pin functions
table.Go
- Changed recommended value of decoupling capacitors. Go
- Added recommended decoupling capacitor layout placement. Go
- Changed
test conditions per DIN EN IEC 60747-17 (VDE
0884-17)
Go
- Changed Ichg lower limit to 430uAGo
- Changed
VAin lower limit to 0.6VGo
- Changed direction of ICLMPI in VCLP-CLMPI test
conditionGo
- Added test condition for soft turn-off currentGo
- Deleted short circuit clamping max conditionGo
- Deleted VDESATL
Go
- Changed from 150ns to 120ns Go
- Changed from 150ns to 148nsGo
- Deleted 9600 V from Value column in the VIOTM
rowGo
- Changed VDE and UL to certifiedGo
- Changed DESAT figureGo
- Changed DESAT soft turn-off figureGo
- Added function state showing gate driver turning on. Changed RDY
condition when VCC is PD. Go
- Added Section 9.2.3
Go
Changes from Revision A (May 2019) to Revision B (December 2019)
- Changed marketing status from Advance Information to production data.Go
- Deleted test voltage, 9600V, from
value columnGo