SLUSDC0C October 2018 – November 2021 UCC21530
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tRISE | Output rise time, 20% to 80% measured points | COUT = 1.8 nF | 6 | 16 | ns | |
tFALL | Output fall time, 90% to 10% measured points | COUT = 1.8 nF | 7 | 12 | ns | |
tPWmin | Minimum pulse width | Output off for less than minimum, COUT = 0 pF | 20 | ns | ||
tPDHL | Propagation delay from INx to OUTx falling edges | 14 | 19 | 30 | ns | |
tPDLH | Propagation delay from INx to OUTx rising edges | 14 | 19 | 30 | ns | |
tPWD | Pulse width distortion |tPDLH – tPDHL| | 6 | ns | |||
tDM | Propagation delays matching between VOUTA, VOUTB | f = 100 kHz | 5 | ns | ||
tVCCI+ to OUT | VCCI
Power-up Delay Time: UVLO Rise to OUTA, OUTB, See Figure 7-5 |
INA or INB tied to VCCI | 40 | µs | ||
tVDD+ to OUT | VDDA,
VDDB Power-up Delay Time: UVLO Rise to OUTA, OUTB See Figure 7-6 |
INA or INB tied to VCCI | 50 | |||
|CMH| | High-level common-mode transient immunity (See Section 7.6) | Slew rate of GND vs. VSSA/B, INA and INB both are tied to GND or VCCI; VCM = 1500 V; | 100 | V/ns | ||
|CML| | Low-level common-mode transient immunity (See Section 7.6) | Slew rate of GND vs. VSSA/B, INA and INB both are tied to GND or VCCI; VCM = 1500 V; | 100 |