SLUSDX3C november   2020  – august 2023 UCC25800-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Device Comparison Table
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Typical Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Power Management
      2. 8.3.2 Oscillator
      3. 8.3.3 External Synchronization
      4. 8.3.4 Dead-Time
        1. 8.3.4.1 Adaptive Dead-time
        2. 8.3.4.2 Maximum Programmable Dead-time
      5. 8.3.5 Protections
        1. 8.3.5.1 Overcurrent Protection
          1. 8.3.5.1.1 OCP Threshold Setting
          2. 8.3.5.1.2 Output Power Capability
        2. 8.3.5.2 Input Overvoltage Protection (OVP)
        3. 8.3.5.3 Over-Temperature Protection (TSD)
        4. 8.3.5.4 Pin-Fault Protections
        5. 8.3.5.5 VREG Pin Protection
      6. 8.3.6 DIS/FLT Pin operation
        1. 8.3.6.1 FAULT Codes
    4. 8.4 Device Functional Modes
      1. 8.4.1 UVLO Mode
      2. 8.4.2 Soft-start Mode
      3. 8.4.3 Normal Operation Mode
      4. 8.4.4 Disabled Mode
      5. 8.4.5 Fault Modes
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 LLC Converter Operation Principle
      2. 9.2.2 Design Requirements
      3. 9.2.3 Detailed Design Procedure
      4. 9.2.4 Application Curves
    3. 9.3 What to Do and What Not to Do
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  14. 13Mechanical, Packaging, and Orderable Information

12.5 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.