SLUUCF2C January 2021 – May 2022 BQ769142
Class | Subclass | Name | Type | Min | Max | Default | Unit |
---|---|---|---|---|---|---|---|
Settings | Manufacturing | Mfg Status Init | H2 | 0x0000 | 0xFFFF | 0x0040 | Hex |
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RSVD_0 | RSVD_0 | RSVD_0 | RSVD_0 | RSVD_0 | RSVD_0 | RSVD_0 | RSVD_0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
OTPW_EN | PF_EN | RSVD_0 | FET_EN | RSVD_0 | RSVD_0 | RSVD_0 | RSVD_0 |
Description: This is the initial Value loaded to Manufacturing Status when the device resets or receives the SEAL or SET_CFGUPDATE commands.
Bit | Field | Default | Description |
---|---|---|---|
7 | OTPW_EN | 0 | This bit enables or disables writes to OTP during operation. The device can program diagnostic information in OTP when a PF occurs or when the fuse is blown to retain state after a full reset. It also can program MANU_DATA upon request (if in FULLACCESS mode). This bit enables the device to program this runtime data to OTP. Programming will only occur when the stack voltage and temperature are within allowed limits. If this bit is not set, programming may still be done in CONFIG_UPDATE mode. 0 = Device will not program OTP during operation. 1 = Device may program OTP during operation. |
6 | PF_EN | 1 | This bit enables or disables Permanent Failure checks. Clearing this bit prevents Permanent Failure from triggering which is useful during manufacturing. 0 = Permanent Failure checks are disabled. 1 = Permanent Failure checks are enabled. |
4 | FET_EN | 0 | This bit enables or disables FET Test mode. In FET Test mode, the FET states are controlled by the FET Test subcommands. This is typically used during manufacturing to test FET circuitry. Note that safety checks still may force FETs off (or for body diode protection, on) in FET Test mode. 0 = Normal FET control is disabled. FET Test mode is enabled. Device will not turn on FETs unless FET Test subcommands instruct it to do so. 1 = Normal FET control is enabled. FET Test mode is disabled. Device will ignore FET Test subcommands. |