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  • Using the UCC14131EVM-070 for Biasing GaN and Gate Driver ICs in Automotive and Industrial Applications

    • SLUUCU2A March   2023  – September 2023 UCC14130-Q1 , UCC14131-Q1

       

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  • Using the UCC14131EVM-070 for Biasing GaN and Gate Driver ICs in Automotive and Industrial Applications
  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 U1 Component Selection
    2. 1.2 Pin Configuration and Functions
  5. 2Description
    1. 2.1 EVM Electrical Performance Specifications
  6. 3Schematic
  7. 4EVM Setup and Operation
    1. 4.1 Recommended Test Equipment
    2. 4.2 External Connections for Easy Evaluation
    3. 4.3 Powering the EVM
      1. 4.3.1 Power on for Start-up
      2. 4.3.2 Power off for Shutdown
    4. 4.4 EVM Test Points
    5. 4.5 Probing the EVM
  8. 5Performance Data
    1. 5.1  Efficiency Data
    2. 5.2  Regulation Data
    3. 5.3  Steady State Input Current
    4. 5.4  Start-Up Waveforms
    5. 5.5  Inrush Current
    6. 5.6  AC Ripple Voltage
    7. 5.7  EN and Timing
    8. 5.8  RLIM
    9. 5.9  Shutdown
    10. 5.10 Thermal Performance
  9. 6Assembly and Printed Circuit Board (PCB) Layers
  10. 7Bill of Materials (BOM)
  11. 8Revision History
  12. IMPORTANT NOTICE
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User's Guide

Using the UCC14131EVM-070 for Biasing GaN and Gate Driver ICs in Automotive and Industrial Applications

 
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