SLUUD24 May   2024 BQ25770G

 

  1.   1
  2.   Description
  3.   Get Started
  4.   Features
  5.   Applications
  6.   6
  7. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
  8. 2Hardware
    1. 2.1 General Description
    2. 2.2 Definitions
    3. 2.3 Equipment
    4. 2.4 Equipment Setup
    5. 2.5 Procedure
      1. 2.5.1 Charge Function
      2. 2.5.2 OTG Function
  9. 3Hardware Design Files
    1. 3.1 Schematic
    2. 3.2 PCB Layout
    3. 3.3 Bill of Materials
  10. 4Additional Information
    1. 4.1 Trademarks

2.2 Definitions

This procedure details how to configure the BMS089 evaluation board. For the test procedure, the following naming conventions are followed. Refer to Section 3.1 for details.

VXXX:External voltage supply name (VIN, VSYS, VBAT).
LOADy:External load name (LOADy).
V(TPyyy):Voltage at internal test point TPyyy. For example, V(TP12) means the voltage at TP12.
V(Jxx):Voltage at jack terminal Jxx.
V(TP(XXX)):Voltage at test point “XXX”. For example, V(ACDET) means the voltage at the test point which is marked as “ACDET”.
V(XXX, YYY):Voltage across point XXX and YYY.
I(JXX(YYY)):Current going out from the YYY terminal of jack XX.
Jxx(BBB):Terminal or pin BBB of jack xx.
JPxx ON :Internal jumper JPxx terminals are shorted.
JPxx OFF:Internal jumper JPxx terminals are open.
JPxx (-YY-) ON:Internal jumper JPxx adjacent terminals marked as “YY” are shorted.
Measure: → A,BCheck specified parameters A, B. If measured values are not within specified limits, the device under test has failed.
Observe → A,BObserve if A, B occurs. If A or B does not occur, the device under test has failed.

Section 3.2 have locations for jumpers, test points, and individual components.