SLVA528D September   2012  – August 2021 TPS65381-Q1 , TPS65381A-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Product Overview
    1. 2.1 Safety Functions and Diagnostics Overview
    2. 2.2 Target Applications
    3. 2.3 Product Safety Constraints
  4. 3Development Process for Management of Systematic Faults
    1. 3.1 TI New-Product Development Process
  5. 4TPS65381x-Q1 Product Architecture for Management of Random Faults
    1. 4.1 Device Operating States
    2.     Device Operating States (continued)
    3. 4.2 NRES (MCU Reset) Driver and ENDRV (SAFING Path Enable) Driver
  6. 5TPS65381x-Q1 Architecture Safety Mechanisms and Assumptions of Use
    1. 5.1 Power Supply
    2. 5.2 Regulated Supplies
      1. 5.2.1 VDD6 Buck Switch-Mode Supply
      2. 5.2.2 VDD5 Linear Supply
      3. 5.2.3 VDD3/5 Linear Supply
      4. 5.2.4 VDD1 Linear Supply
      5. 5.2.5 VSOUT1 Linear Supply
      6. 5.2.6 Charge Pump
    3. 5.3 Diagnostic, Monitoring, and Protection Functions
      1. 5.3.1 External MCU Fault Detection and Management
        1. 5.3.1.1 External MCU Error Signal Monitor (MCU ESM)
        2. 5.3.1.2 Watchdog Timer
      2. 5.3.2 Voltage Monitor (VMON)
      3. 5.3.3 Loss-of-Clock Monitor (LCMON)
      4. 5.3.4 Junction Temperature Monitoring and Current Limiting
      5. 5.3.5 Analog and Digital MUX (AMUX and DMUX) and Diagnostic Output Pin (DIAG_OUT)
      6. 5.3.6 Analog Built-In Self-Test (ABIST)
      7. 5.3.7 Logic Built-In Self-Test (LBIST)
      8. 5.3.8 Device Configuration Register Protection
  7. 6Application Diagrams
    1. 6.1 TPS65381x-Q1 With TMS570
    2. 6.2 TPS65381x-Q1 With C2000
    3. 6.3 TPS65381x-Q1 With TMS470
  8. 7TPS65381x-Q1 as Safety Element out of Context (SEooC)
    1. 7.1 TPS65381x-Q1 Used in an EV/HEV Inverter System
    2. 7.2 SPI Note
  9. 8Revision History

5.3.7 Logic Built-In Self-Test (LBIST)

The LBIST tests the digital-core safety-critical functions and has the follow characteristics:

  • The LBIST includes an application-controllable LBIST engine which applies test vectors to the digital core.
  • The LBIST engine provides stuck-at-fault grade test coverage to logic blocks under test.
  • The LBIST engine has a time-out counter as a fail-safe feature.

The BIST (LBIST with ABIST) is activated with any transition out of the RESET state during power-up events. The BIST is also activated with any other transition out of the RESET state unless the AUTO_BIST_DIS bit in the SAFETY_BIST_CTRL register is set.

For complete details on the LBIST operation, refer to the device data sheet.