SLVA528D September   2012  – August 2021 TPS65381-Q1 , TPS65381A-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Product Overview
    1. 2.1 Safety Functions and Diagnostics Overview
    2. 2.2 Target Applications
    3. 2.3 Product Safety Constraints
  4. 3Development Process for Management of Systematic Faults
    1. 3.1 TI New-Product Development Process
  5. 4TPS65381x-Q1 Product Architecture for Management of Random Faults
    1. 4.1 Device Operating States
    2.     Device Operating States (continued)
    3. 4.2 NRES (MCU Reset) Driver and ENDRV (SAFING Path Enable) Driver
  6. 5TPS65381x-Q1 Architecture Safety Mechanisms and Assumptions of Use
    1. 5.1 Power Supply
    2. 5.2 Regulated Supplies
      1. 5.2.1 VDD6 Buck Switch-Mode Supply
      2. 5.2.2 VDD5 Linear Supply
      3. 5.2.3 VDD3/5 Linear Supply
      4. 5.2.4 VDD1 Linear Supply
      5. 5.2.5 VSOUT1 Linear Supply
      6. 5.2.6 Charge Pump
    3. 5.3 Diagnostic, Monitoring, and Protection Functions
      1. 5.3.1 External MCU Fault Detection and Management
        1. 5.3.1.1 External MCU Error Signal Monitor (MCU ESM)
        2. 5.3.1.2 Watchdog Timer
      2. 5.3.2 Voltage Monitor (VMON)
      3. 5.3.3 Loss-of-Clock Monitor (LCMON)
      4. 5.3.4 Junction Temperature Monitoring and Current Limiting
      5. 5.3.5 Analog and Digital MUX (AMUX and DMUX) and Diagnostic Output Pin (DIAG_OUT)
      6. 5.3.6 Analog Built-In Self-Test (ABIST)
      7. 5.3.7 Logic Built-In Self-Test (LBIST)
      8. 5.3.8 Device Configuration Register Protection
  7. 6Application Diagrams
    1. 6.1 TPS65381x-Q1 With TMS570
    2. 6.2 TPS65381x-Q1 With C2000
    3. 6.3 TPS65381x-Q1 With TMS470
  8. 7TPS65381x-Q1 as Safety Element out of Context (SEooC)
    1. 7.1 TPS65381x-Q1 Used in an EV/HEV Inverter System
    2. 7.2 SPI Note
  9. 8Revision History

2.1 Safety Functions and Diagnostics Overview

The TPS65381x-Q1 device is intended for use in automotive and industrial safety-relevant applications. The following list of monitoring and protection blocks are those that improve the diagnostic coverage and decrease the undetected fault rate:

  • Voltage monitor (VMON)
  • Analog built-in self-test (ABIST) diagnostics for safety analog blocks
  • Logic built-in self-test (LBIST) for safety controller functions
  • Loss-of-clock monitor (LCMON)
  • Junction temperature monitoring (overtemperature)
  • Current-limit for all power supplies with integrated FETs
  • Analog MUX (AMUX) for externally monitored diagnostics and debug
  • Digital MUX (DMUX) for externally monitored diagnostics and debug
  • Watchdog configurable for trigger mode (open and close window) or question and answer mode
  • MCU error signal monitor (ESM) for monitoring the error output from functional safety architecture MCUs
  • Controlled and protected enable output (ENDRV) for external power stages or peripheral wakeup
  • Device configuration register CRC protection
  • EEPROM analog trim content CRC protection
  • SPI command decoder with parity check
  • SPI data output feedback check
  • Reset circuit for initializing external MCU
  • Device state controller with SAFE state in case of detected error event