SLVAE32B August   2018  – December 2023 TPS7H2201-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Device Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Depth, Range, and LETEFF Calculation
  8. 5 Irradiation Facility and Setup
  9. 6 Test Setup and Procedures
  10. 7 Single-Event-Latchup (SEL), Single-Event-Burnout (SEB), and Single-Event-Gate-Rupture (SEGR)
    1. 7.1 Single-Event-Latchup (SEL)
    2. 7.2 Single-Event-Burnout (SEB) and Single-Event-Gate-Rupture (SEGR)
  11. 8 Single Event Transient (SET)
  12. 9 Total Ionizing Dose From SEE Experiments
  13. 10Orbital Environment Estimations
  14. 11Confidence Interval Calculations
    1. 11.1 Rate Orbit Calculation
  15. 12Summary
  16. 13References
  17. 14Revision History

1 Device Overview

The TPS7H2201-SP is a space grade, radiation-hardened, 1.5 to 7 V, 6 A ,e-fuse. The device contains a P-channel MOSFET as the switch element. The device supports a maximum of six amps of continuous current and provides a programmable current limit pin and fast current trip for overcurrent load protection. Additional features of the device include the following:

  • Programmable soft start (used to limit the inrush current)
  • Reverse current protection
  • Programmable fault timers for current limit and re-try modes
  • Thermal shutdown
  • Programmable EN and OVP voltage
  • A pin (CS) that outputs a current proportional to the current across the pass element for health monitoring

The device is offered in a thermally enhanced 16-pin ceramic, dual in-line flat-pack package. Table 1-1 lists the general device information and test conditions. See the TPS7H2201-SP product page for more detailed technical specifications, user guides, and applications notes.

Table 1-1 Overview Information
Description Device Information
TI Part NumberTPS7H2201-SP
SMD Number5962R1722001VXC
Device FunctioneFuse
Technology250 nm Linear BiCMOS 7
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University
Heavy Ion Fluence per Run≥ 1 x 107 ions / cm2
Irradiation Temperature25°C and 125°C (for SEL testing)