SLVAEJ9A December 2019 – July 2021 TPS1HA08-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS1HA08-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to Ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPS1HA08-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS1HA08-Q1 data sheet.
Figure 4-1 Pin DiagramFollowing are the assumptions of use and the device configuration assumed for the pin FMA in this section:
- Follow data sheet recommendation for operating conditions, external component selection and PCB layout
Table 4-2 Pin FMA for Device Pins Short-Circuited to
Ground
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | Resistor/diode network will be bypassed if present. | B |
| SNS | 2 | SNS current diagnostic not available. | B |
| LATCH | 3 | Normal operation. With device in auto-retry mode. | B |
| EN | 4 | Normal operation with output off (FET turned off). | B |
| ST | 5 | Open drain fault diagnostics cannot be reported. | B |
| VOUT | 6, 7, 8, 9, 10, 11 | Short to GND protection kicks in to protect the device. | B |
| NC | 12, 13 | No effect. | D |
| SEL1 | 14 | Normal operation with diagnostics corresponding to SEL1=LOW. | B |
| SEL2 | 15 | Normal operation with diagnostics corresponding to SEL2=LOW. | B |
| DIAG_EN | 16 | Normal operation with diagnostics function disabled. | B |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | The output FET is turned off. | B |
| SNS | 2 | SNS current diagnostic not available. | B |
| LATCH | 3 | Normal operation with device in auto-retry mode. Internal pull-down resistor will pull pin to GND. | B |
| EN | 4 | Normal operation with output off (FET turned off). Internal pull-down resistor will pull pin to GND. | B |
| ST | 5 | Open drain fault diagnostics cannot be reported. | B |
| VOUT | 6, 7, 8, 9, 10, 11 | Output off. Open load detection will be triggered in off-state while in diagnostics state. | B |
| NC | 12, 13 | No effect. | D |
| SEL1 | 14 | Normal operation with diagnostics corresponding to SEL1=LOW. Internal pull-down resistor will pull pin to GND. | B |
| SEL2 | 15 | Normal operation with diagnostics corresponding to SEL2=LOW. Internal pull-down resistor will pull pin to GND. | B |
| DIAG_EN | 16 | Normal operation with diagnostics function disabled. Internal pull-down resistor will pull pin to GND. | B |
Table 4-4 Pin FMA for Device Pins Short-Circuited to
Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| GND | 1 | 2 (SNS) | SNS current diagnostic not available. | B |
| SNS | 2 | 3 (LATCH) | Undefined device behavior depends on pin voltage. Sense output may not be correct. Latch function may be enabled if pin voltage > VIH; latch function may be disabled if pin voltage < VIL. | B |
| LATCH | 3 | 4 (EN) | Device behavior depends on pin voltage. Latch function may be enabled if pin voltage > VIH; latch function may be disabled if pin voltage < VIL. | B |
| EN | 4 | 5 (ST) | Undefined device behavior. Channel may be enabled if pin voltage > VIH; channel may be disabled if pin voltage < VIL. Open drain fault reporting could not be correct. | B |
| ST | 5 | 6 (VOUT) | Open drain fault diagnostics cannot be reported. VOUT behavior may not be correct. | B |
| VOUT | 6, 7, 8, 9, 10, 11 | 12 (NC) | No effect. | D |
| NC | 12, 13 | 14 (SEL1) | No effect. | D |
| SEL1 | 14 | 15 (SEL2) | Device behavior depends on adjacent pin voltage affecting diagnostic output. | B |
| SEL2 | 15 | 16 (DIAG_EN) | Device behavior depends on adjacent pin voltage affecting diagnostic output. Diagnostic function may be enabled if pin voltage > VIH; Diagnostic function may be disabled if pin voltage < VIL. | B |
| DIAG_EN | 16 | 15 (SEL2) | Device behavior depends on adjacent pin voltage affecting diagnostic output. Diagnostic function may be enabled if pin voltage > VIH; Diagnostic function may be disabled if pin voltage < VIL. | B |
Table 4-5 Pin FMA for Device Pins
Short-Circuited to
supply
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| GND | 1 | Supply power will be bypassed and device will not turn on. | B |
| SNS | 2 | If pin voltage exceeds the pin data sheet range, it may cause device damage due to voltage breakdown on ESD circuit. | A |
| LATCH | 3 | If pin voltage exceeds the pin data sheet range, it may cause device damage due to voltage breakdown on ESD circuit. Device behavior depends on supply voltage. | A |
| EN | 4 | If pin voltage exceeds the pin data sheet range, it may cause device damage due to voltage breakdown on ESD circuit. | A |
| ST | 5 | Fault indication will be incorrect. | B |
| VOUT | 6, 7, 8, 9, 10, 11 | Output stuck onto supply. Open load detection will be triggered in off-state diagnostics state. | C |
| NC | 12, 13 | No effect. | D |
| SEL1 | 14 | If pin voltage exceeds the pin data sheet range, it may cause device damage due to voltage breakdown on ESD circuit. | A |
| SEL2 | 15 | If pin voltage exceeds the pin data sheet range, it may cause device damage due to voltage breakdown on ESD circuit. | A |
| DIAG_EN | 16 | If pin voltage exceeds the pin data sheet range, it may cause device damage due to voltage breakdown on ESD circuit. | A |