1 Overview

This document contains information for DRV8873H-Q1 (HTSSOP(24) package, HW variant) and DRV8873S-Q1 (HTSSOP(24) package, SPI variant) to aid in a functional safety system design. Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (Pin FMA)

DRV8873-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.

Figure 1-1 shows the functional block diagram for the HW variant of this device as a reference.

Figure 1-1 DRV8873H-Q1 Device Block Diagram - HW variant

Figure 1-2 shows the functional block diagram for the HW variant of this device as a reference.

Figure 1-2 DRV8873S-Q1 Device Block Diagram - SPI variant